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Title: Making sense of nanocrystal lattice fringes

Abstract

The orientation dependence of thin-crystal lattice fringes can be gracefully quantified using fringe-visibility maps, a direct-space analog of Kikuchi maps [Nishikawa and Kikuchi, Nature (London) 121, 1019 (1928)]. As in navigation of reciprocal space with the aid of Kikuchi lines, fringe-visibility maps facilitate acquisition of crystallographic information from lattice images. In particular, these maps can help researchers to determine the three-dimensional lattice of individual nanocrystals, to 'fringe-fingerprint' collections of randomly oriented particles, and to measure local specimen thickness with only a modest tilt. Since the number of fringes in an image increases with maximum spatial-frequency squared, these strategies (with help from more precise goniometers) will be more useful as aberration correction moves resolutions into the subangstrom range.

Authors:
; ; ;  [1];  [2];  [2];  [2]
  1. Department of Physics and Astronomy and Center for Molecular Electronics, U. Missouri-StL, St. Louis, Missouri 63121 (United States)
  2. (United States)
Publication Date:
OSTI Identifier:
20714157
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 98; Journal Issue: 11; Other Information: DOI: 10.1063/1.2135414; (c) 2005 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; CORRECTIONS; CRYSTAL LATTICES; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; GONIOMETERS; IMAGES; KIKUCHI LINES; NANOSTRUCTURES; ORIENTATION; PARTICLES; THICKNESS; THREE-DIMENSIONAL CALCULATIONS

Citation Formats

Fraundorf, P., Qin Wentao, Moeck, Peter, Mandell, Eric, Advanced Products R and D Laboratory, Freescale Semiconductor, Inc., Chandler, Arizona 85224, Department of Physics, Portland State University, P.O. Box 751, Portland, Oregon 97207-0751, and Department of Physics and Astronomy and Center for Molecular Electronics, U. Missouri-StL, St. Louis, Missouri 63121. Making sense of nanocrystal lattice fringes. United States: N. p., 2005. Web. doi:10.1063/1.2135414.
Fraundorf, P., Qin Wentao, Moeck, Peter, Mandell, Eric, Advanced Products R and D Laboratory, Freescale Semiconductor, Inc., Chandler, Arizona 85224, Department of Physics, Portland State University, P.O. Box 751, Portland, Oregon 97207-0751, & Department of Physics and Astronomy and Center for Molecular Electronics, U. Missouri-StL, St. Louis, Missouri 63121. Making sense of nanocrystal lattice fringes. United States. doi:10.1063/1.2135414.
Fraundorf, P., Qin Wentao, Moeck, Peter, Mandell, Eric, Advanced Products R and D Laboratory, Freescale Semiconductor, Inc., Chandler, Arizona 85224, Department of Physics, Portland State University, P.O. Box 751, Portland, Oregon 97207-0751, and Department of Physics and Astronomy and Center for Molecular Electronics, U. Missouri-StL, St. Louis, Missouri 63121. Thu . "Making sense of nanocrystal lattice fringes". United States. doi:10.1063/1.2135414.
@article{osti_20714157,
title = {Making sense of nanocrystal lattice fringes},
author = {Fraundorf, P. and Qin Wentao and Moeck, Peter and Mandell, Eric and Advanced Products R and D Laboratory, Freescale Semiconductor, Inc., Chandler, Arizona 85224 and Department of Physics, Portland State University, P.O. Box 751, Portland, Oregon 97207-0751 and Department of Physics and Astronomy and Center for Molecular Electronics, U. Missouri-StL, St. Louis, Missouri 63121},
abstractNote = {The orientation dependence of thin-crystal lattice fringes can be gracefully quantified using fringe-visibility maps, a direct-space analog of Kikuchi maps [Nishikawa and Kikuchi, Nature (London) 121, 1019 (1928)]. As in navigation of reciprocal space with the aid of Kikuchi lines, fringe-visibility maps facilitate acquisition of crystallographic information from lattice images. In particular, these maps can help researchers to determine the three-dimensional lattice of individual nanocrystals, to 'fringe-fingerprint' collections of randomly oriented particles, and to measure local specimen thickness with only a modest tilt. Since the number of fringes in an image increases with maximum spatial-frequency squared, these strategies (with help from more precise goniometers) will be more useful as aberration correction moves resolutions into the subangstrom range.},
doi = {10.1063/1.2135414},
journal = {Journal of Applied Physics},
number = 11,
volume = 98,
place = {United States},
year = {Thu Dec 01 00:00:00 EST 2005},
month = {Thu Dec 01 00:00:00 EST 2005}
}