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Title: Implications of B{sup 0}{yields}D{sup 0}{pi}{sup 0} decays on B{yields}DK, DK decays

Journal Article · · Physical Review. D, Particles Fields
;  [1]
  1. Institute of Physics, Academia Sinica, Taipei, Taiwan 115 (China)

The recently observed color-suppressed B{sup 0}{yields}D{sup 0}{pi}{sup 0}, D{sup 0}{eta}{sup (')}, D{sub s}{sup +}K{sup -} and D{sup 0}K{sup 0} decay modes all have rates larger than expected, hinting at the presence of final state interactions. We study rescattering effects in B{yields}DP, DK and DK modes in the quasielastic approach, which is extended to accommodate D{sup 0}{eta}{sup '} without using U(3) symmetry. The D{sup 0}K modes are of interest in the determination of the unitarity angle {phi}{sub 3}/{gamma}. The updated DP data are used to extract the effective Wilson coefficients a{sub 1}{sup eff}{approx_equal}0.92, a{sub 2}{sup eff}{approx_equal}0.22, three strong phases {delta}{approx_equal}62 deg., {theta}{approx_equal}24 deg., {sigma}{approx_equal}127 deg., and the mixing angle {tau}{approx_equal}2 deg. The values of {delta} and {theta} are close to our previous results. The smallness of {tau} implies small mixing of D{sup 0}{eta}{sub 1} with other modes. Predictions for D{sup 0}K{sup -}, D{sup +}K{sup -} and D{sup 0}K{sup 0} agree with data. Since strong interaction respects charge conjugation symmetry, the framework applies to B{yields}DK, and rates for D{sup 0}K{sup -}, D{sup -}K{sup 0}, D{sub s}{sup -}{pi}{sup 0}, D{sub s}{sup -}{eta} and D{sub s}{sup -}{eta}{sup '} modes are predicted. From B{sup -}{yields}D{sup 0}K{sup -} and D{sup 0}K{sup -} rates, we find r{sub B}=0.09{+-}0.02, where the error is propagated from the experimental DP rate uncertainties. The error on r{sub B} is doubled when the universality on a{sub 2}{sup eff} is relaxed.

OSTI ID:
20711272
Journal Information:
Physical Review. D, Particles Fields, Vol. 72, Issue 3; Other Information: DOI: 10.1103/PhysRevD.72.036002; (c) 2005 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 0556-2821
Country of Publication:
United States
Language:
English