Charge transfer and formation of conducting C{sub 60} monolayers at C{sub 60}/noble-metal interfaces
- Department of Nuclear Engineering, Graduate School of Engineering, Kyoto University, Yoshidahonmachi, Sakyo, Kyoto 606-8501 (Japan)
The resistance of a conducting C{sub 60} monolayer formed on a polycrystalline Ag film was found to be 0.7{+-}0.1 k{omega} by in situ resistance measurements. By another series of in situ resistance measurements, the surface scattering cross sections, whose magnitude represents the relative amount of transferred charge, were evaluated as 100 A{sup 2} for C{sub 60}/Au, and 150 A{sup 2} for C{sub 60}/Cu and C{sub 60}/Ag systems. However, comparison with previous results obtained for monolayers formed on Au and Cu films showed that the resistances of conducting C{sub 60} monolayers do not show a simple dependence on the transferred charge. Atomic force microscopy measurements revealed that the grain size of the underlying noble metals also plays an important role.
- OSTI ID:
- 20709655
- Journal Information:
- Journal of Applied Physics, Vol. 97, Issue 10; Other Information: DOI: 10.1063/1.1897840; (c) 2005 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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