Self-referenced prism deflection measurement schemes with microradian precision

Journal Article · Mon Aug 01 00:00:00 EDT 2005 · Applied Optics

DOI:https://doi.org/10.1364/AO.44.004639· OSTI ID:20702612

Olson, Rebecca; Paul, Justin; Bergeson, Scott; Durfee, Dallin S

We have demonstrated several inexpensive methods that can be used to measure the deflection angles of prisms with microradian precision. The methods are self-referenced, where various reversals are used to achieve absolute measurements without the need of a reference prism or any expensive precision components other than the prisms under test. These techniques are based on laser interferometry and have been used in our laboratory to characterize parallel-plate beam splitters, penta prisms, right-angle prisms, and corner cube reflectors using only components typically available in an optics laboratory.

• OSTI ID: 20702612
• Journal Information: Applied Optics, Vol. 44, Issue 22; Other Information: DOI: 10.1364/AO.44.004639; (c) 2005 Optical Society of America; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6935
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ACCURACY
BEAM SPLITTING
INTERFEROMETRY
LASERS
OPTICS
PRISMS
VISIBLE RADIATION