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Title: Direct Evidence of Nanometric Invasionlike Grain Boundary Penetration in the Al/Ga System

Abstract

We report the first in situ results of deformation during grain boundary penetration in the Al/Ga system, obtained with a novel, nondestructive hard x-ray synchrotron projection microscopy technique. Focusing the beam to a state-of-the-art spot size of 90x90 nm{sup 2}, we demonstrate that penetration is accompanied by continuous relative separation of the Al grains of the same final amplitude as the final Ga layer thickness in the absence of external stress. The formation of nanometric intergranular liquid layers is originated by a crack propagation process and inherently implies the presence of weak stress levels.

Authors:
;  [1];  [1];  [2];  [3];  [3];  [2]
  1. European Synchrotron Radiation Facility, BP 220, 38043 Grenoble (France)
  2. (France)
  3. Laboratoire Genie Physique et Mecanique des Materiaux, ENSPG, BP 46, 38 400 Saint-Martin-d'Heres Cedex (France)
Publication Date:
OSTI Identifier:
20699587
Resource Type:
Journal Article
Resource Relation:
Journal Name: Physical Review Letters; Journal Volume: 95; Journal Issue: 21; Other Information: DOI: 10.1103/PhysRevLett.95.215501; (c) 2005 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ALUMINIUM; AMPLITUDES; CRACK PROPAGATION; DEFORMATION; EMBRITTLEMENT; FOCUSING; GALLIUM; GRAIN BOUNDARIES; HARD X RADIATION; LAYERS; LIQUID METALS; MICROSCOPY; NANOSTRUCTURES; STRESSES; THICKNESS

Citation Formats

Pereiro-Lopez, E., Cloetens, P., Ludwig, W., Groupe d'Etude de Metallurgie Physique et de Physique des Materiaux, INSA de Lyon, 69621 Villeurbanne Cedex, Bellet, D., Lemaignan, C., and CEA DEC-Dir, CEA Grenoble, 38041 Grenoble. Direct Evidence of Nanometric Invasionlike Grain Boundary Penetration in the Al/Ga System. United States: N. p., 2005. Web. doi:10.1103/PhysRevLett.95.215501.
Pereiro-Lopez, E., Cloetens, P., Ludwig, W., Groupe d'Etude de Metallurgie Physique et de Physique des Materiaux, INSA de Lyon, 69621 Villeurbanne Cedex, Bellet, D., Lemaignan, C., & CEA DEC-Dir, CEA Grenoble, 38041 Grenoble. Direct Evidence of Nanometric Invasionlike Grain Boundary Penetration in the Al/Ga System. United States. doi:10.1103/PhysRevLett.95.215501.
Pereiro-Lopez, E., Cloetens, P., Ludwig, W., Groupe d'Etude de Metallurgie Physique et de Physique des Materiaux, INSA de Lyon, 69621 Villeurbanne Cedex, Bellet, D., Lemaignan, C., and CEA DEC-Dir, CEA Grenoble, 38041 Grenoble. Fri . "Direct Evidence of Nanometric Invasionlike Grain Boundary Penetration in the Al/Ga System". United States. doi:10.1103/PhysRevLett.95.215501.
@article{osti_20699587,
title = {Direct Evidence of Nanometric Invasionlike Grain Boundary Penetration in the Al/Ga System},
author = {Pereiro-Lopez, E. and Cloetens, P. and Ludwig, W. and Groupe d'Etude de Metallurgie Physique et de Physique des Materiaux, INSA de Lyon, 69621 Villeurbanne Cedex and Bellet, D. and Lemaignan, C. and CEA DEC-Dir, CEA Grenoble, 38041 Grenoble},
abstractNote = {We report the first in situ results of deformation during grain boundary penetration in the Al/Ga system, obtained with a novel, nondestructive hard x-ray synchrotron projection microscopy technique. Focusing the beam to a state-of-the-art spot size of 90x90 nm{sup 2}, we demonstrate that penetration is accompanied by continuous relative separation of the Al grains of the same final amplitude as the final Ga layer thickness in the absence of external stress. The formation of nanometric intergranular liquid layers is originated by a crack propagation process and inherently implies the presence of weak stress levels.},
doi = {10.1103/PhysRevLett.95.215501},
journal = {Physical Review Letters},
number = 21,
volume = 95,
place = {United States},
year = {Fri Nov 18 00:00:00 EST 2005},
month = {Fri Nov 18 00:00:00 EST 2005}
}