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Title: Polarization fatigue in PbZr{sub 0.45}Ti{sub 0.55}O{sub 3}-based capacitors studied from high resolution synchrotron x-ray diffraction

Abstract

High resolution synchrotron x-ray diffraction experiments were performed on (111)-oriented PbZr{sub 0.45}Ti{sub 0.55}O{sub 3}-based capacitors with a composition in the morphotropic region. Diffraction analyzes were done after bipolar pulses were applied and removed, representing several places in the cyclic switching. Microstructural changes were evidenced from relative diffracted intensities variations of several Bragg reflections and a correlation with the evolution of the ferroelectric responses has been established. First, a peculiar microstructural evolution was observed during the first 3x10{sup 4} switching cycles and was attributed to the so-called 'wake-up' effect. On the other hand, the onset of the fatigue phenomenon was accompanied by significant variations on integrated diffraction intensities. Several mechanisms are proposed and discussed to explain such variations. Finally, the ferroelectric responses were analyzed after x-ray diffraction experiments and compared with those measured before exposure. A detailed analysis has shown that both domain configuration and switching process are strongly influenced by x-ray irradiation. It can be considered that x rays act as a 'revealer' of the domain structure created during the preceding electrical treatment.

Authors:
; ; ; ;  [1]
  1. Laboratoire Materiaux et Microelectronique de Provence (L2MP), UMR CNRS 6137, Universite du Sud Toulon Var, BP 20132, F-83957 La Garde Cedex (France)
Publication Date:
OSTI Identifier:
20668253
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 97; Journal Issue: 6; Other Information: DOI: 10.1063/1.1870098; (c) 2005 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0021-8979
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; BRAGG REFLECTION; CAPACITORS; CORRELATIONS; CRYSTAL STRUCTURE; DOMAIN STRUCTURE; EVOLUTION; FATIGUE; FERROELECTRIC MATERIALS; HYSTERESIS; IRRADIATION; LEAD COMPOUNDS; MICROSTRUCTURE; POLARIZATION; PULSES; SYNCHROTRONS; THIN FILMS; TITANATES; X-RAY DIFFRACTION; ZIRCONIUM COMPOUNDS

Citation Formats

Menou, N, Muller, Ch, Baturin, I S, Shur, V Ya, Hodeau, J -L, Institute of Physics and Applied Mathematics, Ural State University, Lenin Ave. 51, 620083 Ekaterinburg, and Laboratoire de Cristallographie, BP 166, F-38042 Grenoble Cedex 9. Polarization fatigue in PbZr{sub 0.45}Ti{sub 0.55}O{sub 3}-based capacitors studied from high resolution synchrotron x-ray diffraction. United States: N. p., 2005. Web. doi:10.1063/1.1870098.
Menou, N, Muller, Ch, Baturin, I S, Shur, V Ya, Hodeau, J -L, Institute of Physics and Applied Mathematics, Ural State University, Lenin Ave. 51, 620083 Ekaterinburg, & Laboratoire de Cristallographie, BP 166, F-38042 Grenoble Cedex 9. Polarization fatigue in PbZr{sub 0.45}Ti{sub 0.55}O{sub 3}-based capacitors studied from high resolution synchrotron x-ray diffraction. United States. https://doi.org/10.1063/1.1870098
Menou, N, Muller, Ch, Baturin, I S, Shur, V Ya, Hodeau, J -L, Institute of Physics and Applied Mathematics, Ural State University, Lenin Ave. 51, 620083 Ekaterinburg, and Laboratoire de Cristallographie, BP 166, F-38042 Grenoble Cedex 9. 2005. "Polarization fatigue in PbZr{sub 0.45}Ti{sub 0.55}O{sub 3}-based capacitors studied from high resolution synchrotron x-ray diffraction". United States. https://doi.org/10.1063/1.1870098.
@article{osti_20668253,
title = {Polarization fatigue in PbZr{sub 0.45}Ti{sub 0.55}O{sub 3}-based capacitors studied from high resolution synchrotron x-ray diffraction},
author = {Menou, N and Muller, Ch and Baturin, I S and Shur, V Ya and Hodeau, J -L and Institute of Physics and Applied Mathematics, Ural State University, Lenin Ave. 51, 620083 Ekaterinburg and Laboratoire de Cristallographie, BP 166, F-38042 Grenoble Cedex 9},
abstractNote = {High resolution synchrotron x-ray diffraction experiments were performed on (111)-oriented PbZr{sub 0.45}Ti{sub 0.55}O{sub 3}-based capacitors with a composition in the morphotropic region. Diffraction analyzes were done after bipolar pulses were applied and removed, representing several places in the cyclic switching. Microstructural changes were evidenced from relative diffracted intensities variations of several Bragg reflections and a correlation with the evolution of the ferroelectric responses has been established. First, a peculiar microstructural evolution was observed during the first 3x10{sup 4} switching cycles and was attributed to the so-called 'wake-up' effect. On the other hand, the onset of the fatigue phenomenon was accompanied by significant variations on integrated diffraction intensities. Several mechanisms are proposed and discussed to explain such variations. Finally, the ferroelectric responses were analyzed after x-ray diffraction experiments and compared with those measured before exposure. A detailed analysis has shown that both domain configuration and switching process are strongly influenced by x-ray irradiation. It can be considered that x rays act as a 'revealer' of the domain structure created during the preceding electrical treatment.},
doi = {10.1063/1.1870098},
url = {https://www.osti.gov/biblio/20668253}, journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 6,
volume = 97,
place = {United States},
year = {Tue Mar 15 00:00:00 EST 2005},
month = {Tue Mar 15 00:00:00 EST 2005}
}