Insights into microstructural evolution from nanocrystalline SnO{sub 2} thin films prepared by pulsed laser deposition
- Department of Physics and Materials Science, City University of Hong Kong, Tat Chee Avenue, Kowloon Tong, Hong Kong (China)
Low-dimensional nanostructures of SnO{sub 2} thin films with the interesting features of the tetragonal rutile structure have been prepared by pulsed laser deposition. The microstructural evolution of nanocrystalline SnO{sub 2} thin films has been investigated using x-ray diffraction, transmission electron microscopy, high-resolution transmission electron microscopy, and Raman spectroscopy. Experimental results indicate that the as-prepared SnO{sub 2} thin films appear to be of polycrystalline state, have a large amount of defects, such as oxygen vacancies, vacancy clusters, and local lattice disorder at the interface and surface, and the appearance of a new Raman peak. It suggests that this new Raman peak is closely related to a surface layer of nonstoichiometic SnO{sub x} with different symmetries than SnO{sub 2}, or in other words, the new peak marks an additional characteristic of space symmetry of the grain agglomeration of nanocrystalline SnO{sub 2}. The study of the microstructural evolution of nanocrystalline SnO{sub 2} is significant for the understanding of the whole structure feature of nanomaterials and for the fabrication of new nanomaterials with favorable properties.
- OSTI ID:
- 20664931
- Journal Information:
- Physical Review. B, Condensed Matter and Materials Physics, Vol. 70, Issue 16; Other Information: DOI: 10.1103/PhysRevB.70.165314; (c) 2004 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1098-0121
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
DEFECTS
ENERGY BEAM DEPOSITION
EVOLUTION
FABRICATION
GRAIN GROWTH
INTERFACES
LASER RADIATION
LAYERS
MICROSTRUCTURE
NANOSTRUCTURES
POLYCRYSTALS
PULSED IRRADIATION
RAMAN SPECTRA
RAMAN SPECTROSCOPY
RUTILE
SEMICONDUCTOR MATERIALS
SURFACES
THIN FILMS
TIN OXIDES
TRANSMISSION ELECTRON MICROSCOPY
VACANCIES
X-RAY DIFFRACTION