Theoretical Analysis of X-ray Compound Refractive Lens Optical Properties

Journal Article · Wed May 12 00:00:00 EDT 2004 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.1757917· OSTI ID:20653073

Kohn, V ^[1]; Snigireva, I; Snigirev, A ^[2]

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1. Russian Research Center 'Kurchatov Institute', 123182 Moscow (Russian Federation)
2. ESRF, B.P. 220, 38043 Grenoble (France)

We present a theoretical analysis of optical properties of parabolic compound refractive lenses (CRL). The parabolic CRL with a large number of elements is considered as a parabolic medium along the x-ray path. The problem of x-ray coherent wave propagation inside such a medium is solved exactly. The analytical formula is obtained for the parabolic CRL imaging propagator as a parabolic wave with complex parameters due to absorption of x rays inside the lens. The fast and universal computer program is developed for simulating the CRL generated images. An imaging example of a test object as a silicon plate of 3 {mu}m thickness with a round hole of 3 {mu}m diameter is presented and discussed in details. The main optical parameters of parabolic CRL such as an effective aperture, a diffraction limited resolution and a focal distance are calculated analytically and discussed. It is shown that parabolic CRL has no spherical aberration while long single plano-concave and bi-concave lenses have.

• OSTI ID: 20653073
• Journal Information: AIP Conference Proceedings, Vol. 705, Issue 1; Conference: 8. international conference on synchrotron radiation instrumentation, San Francisco, CA (United States), 25-29 Aug 2003; Other Information: DOI: 10.1063/1.1757917; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ABSORPTION
APERTURES
COMPUTER CODES
DIFFRACTION
GEOMETRICAL ABERRATIONS
IMAGES
LENSES
MICROSTRUCTURE
NUMERICAL ANALYSIS
OPTICAL PROPERTIES
PLATES
PROPAGATOR
REFRACTION
RESOLUTION
SILICON
SYNCHROTRON RADIATION
THICKNESS
WAVE PROPAGATION
X RADIATION