X-ray Si-based Integrated Lens System for Wide Range of Hard Synchrotron Radiation

Journal Article · Wed May 12 00:00:00 EDT 2004 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.1757894· OSTI ID:20653048

Snigireva, I; Snigirev, A; Drakopoulos, M ^[1]; Yunkin, V; Grigoriev, M; Kuznetsov, S; Chukalina, M ^[2]; Hoffmann, M; Nuesse, D; Voges, E ^[3]

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1. ESRF, B. P. 220, 38043 Grenoble (France)
2. Institute of Microelectronics Technology RAS, 142432 Chernogolovka (Russian Federation)
3. Dortmund University, D-44227 Dortmund (Germany)

We present integrated lens system (ILS), which consists of 6 compound refractive lenses with the same focal distance of 0.5m, but optimized for discrete set of energies such as 10, 12, 14, 16, 18, 20 keV. Focusing properties were tested at the ESRF BM-5 and ID18F beamlines. It was shown, that all compound refractive lenses in the system focus X-rays at 0.5 m with accuracy of 2% in changing energy according to the lens design. Focusing of 0.6 micron with the gain of 50 was demonstrated at 14 keV.

• OSTI ID: 20653048
• Journal Information: AIP Conference Proceedings, Vol. 705, Issue 1; Conference: 8. international conference on synchrotron radiation instrumentation, San Francisco, CA (United States), 25-29 Aug 2003; Other Information: DOI: 10.1063/1.1757894; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ACCURACY
BEAM OPTICS
EUROPEAN SYNCHROTRON RADIATION FACILITY
FOCUSING
KEV RANGE 10-100
LENSES
QUARTZ
SILICON
SYNCHROTRON RADIATION
X RADIATION