Gas-Monitor Detector for Intense and Pulsed VUV/EUV Free-Electron Laser Radiation

Journal Article · Wed May 12 00:00:00 EDT 2004 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.1757857· OSTI ID:20653007

Sorokin, A A ^[1]; Bobashev, S V; Shmaenok, L A ^[2]; Feldhaus, J; Gerth, Ch; Hahn, U; Steeg, B; Tiedtke, K; Treusch, R ^[3]; Gottwald, A; Kroth, U; Richter, M ^[1]

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1. Physikalisch-Technische Bundesanstalt, Abbestr. 2-12, 10587 Berlin (Germany)
2. Ioffe Physico-Technical Institute RAS, Polytekhnicheskay 26, 194021 St.Petersburg (Russian Federation)
3. Deutsches Elektronen-Synchrotron, DESY, Notkestr. 85, 22603 Hamburg (Germany)

In the framework of current developments of new powerful VUV and EUV radiation sources, like VUV free-electron-lasers or EUV plasma sources for 13-nm lithography, we developed a gas-monitor detector in order to measure the photon flux of highly intense and extremely pulsed VUV and EUV radiation in absolute terms. The device is based on atomic photoionization of a rare gas at low particle density. Therefore, it is free of degradation and almost transparent, which allows the detector to be used as a continuously working beam-intensity monitor. The extended dynamic range of the detector allowed its calibration with relative standard uncertainties of 4% in the Radiometry Laboratory of the Physikalisch-Technische Bundesanstalt at the electron-storage ring BESSY II in Berlin using spectrally dispersed synchrotron radiation at low photon intensities and its utilization for absolute photon flux measurements of high power sources. In the present contribution, we describe the design of the detector and its application for the characterization of VUV free-electron-laser radiation at the TESLA test facility in Hamburg. By first pulse resolved measurements, a peak power of more than 100 MW at a wavelength of 87 nm was detected.

• OSTI ID: 20653007
• Journal Information: AIP Conference Proceedings, Vol. 705, Issue 1; Conference: 8. international conference on synchrotron radiation instrumentation, San Francisco, CA (United States), 25-29 Aug 2003; Other Information: DOI: 10.1063/1.1757857; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
BEAM MONITORS
BEAM OPTICS
BESSY STORAGE RING
CALIBRATION
ELECTRONS
EQUIPMENT
EXTREME ULTRAVIOLET RADIATION
FAR ULTRAVIOLET RADIATION
FREE ELECTRON LASERS
LIGHT SOURCES
PEAK LOAD
PHOTOIONIZATION
PHOTONS
PLASMA
PULSES
SYNCHROTRON RADIATION
TEST FACILITIES
ULTRAVIOLET SPECTRA
X RADIATION