Performance Of An Infrared Beamline For High Spatial Resolution FTIR Microscopy

Journal Article · Wed May 12 00:00:00 EDT 2004 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.1757838· OSTI ID:20652986

Lo, Y C; Chen, C I; Chang, C H; Wang, C; Tsang, K L ^[1]

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1. National Synchrotron Radiation Research Center, 101 Hsin-Ann Road, Science Based Industrial Park, 30007, Taiwan (China)

We have constructed and commissioned an infrared beamline mainly for high spatial resolution microanalysis by FTIR microscopy. This beamline collects 70 x 35 mrad radiation fan and covers a wavelength range from 2 to 30 {mu}m which provides an optimal performance capability down to 400 1/cm (25 microns). The optics consists of one water-cooled plane mirror, two high-order polynomial bendable focusing mirrors, and one set of steering and collimating mirrors. Two high-order bendable polynomial mirrors are designed and constructed to effectively collect and focus the 70 mrad extended arc radiation source onto a focal point. To achieve high mechanical stability, the photon beam is reflected downwards 90 degrees by the first mirror and the mirror holder is attached to the massive bending magnet girder. The high stability of mirror manipulators and supporters, has been confirmed by the vibrational measurement with accelerometers during the beamline operation. The brightness of the infrared spectrum has been measured and compared to a standard thermal source with different pinhole sizes, exhibiting values to be greater than that of standard thermal source when the pinhole is set at < 30 um. The signal to noise (S/N) ratio measured in the mid infrared region is about 500 times greater than that obtained from a blackbody source when the pinhole size is < 10 um. In this report we will present the performance of this infrared beamline and the high spatial resolution data by FTIR microscopy.

• OSTI ID: 20652986
• Journal Information: AIP Conference Proceedings, Vol. 705, Issue 1; Conference: 8. international conference on synchrotron radiation instrumentation, San Francisco, CA (United States), 25-29 Aug 2003; Other Information: DOI: 10.1063/1.1757838; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
ABSORPTION SPECTROSCOPY
ACCELERATORS
ACCELEROMETERS
BEAM OPTICS
BENDING
BRIGHTNESS
ELECTRONS
FOURIER TRANSFORM SPECTROMETERS
FOURIER TRANSFORMATION
INFRARED SPECTRA
MAGNETS
MANIPULATORS
MICROANALYSIS
MICROSCOPY
MIRRORS
PERFORMANCE
PHOTON BEAMS
RADIATION SOURCES
SPATIAL RESOLUTION
SYNCHROTRON RADIATION