Characterization of Beryllium Windows Using Coherent X-rays at 1-km Beamline

Journal Article · Wed May 12 00:00:00 EDT 2004 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.1757818· OSTI ID:20652965

Goto, Shunji; Yabashi, Makina; Takahashi, Sunao ^[1]; Tamasaku, Kenji ^[2]; Ishikawa, Tetsuya ^[1]

---

1. SPring-8/JASRI, 1-1-1 Kouto, Mikazuki 679-5198 (Japan)
2. SPring-8/RIKEN, 1-1-1 Kouto, Mikazuki 679-5148 (Japan)

Beryllium windows were characterized using coherent x-rays at the one-kilometer beamline of SPring-8. Non-uniformity of transmission x-ray images is largely due to Fresnel diffraction from deficiencies such as surface pits with diameter of order of one micron to ten microns, having no correlation with averaged surface roughness measured with an optical profilometer.

• OSTI ID: 20652965
• Journal Information: AIP Conference Proceedings, Vol. 705, Issue 1; Conference: 8. international conference on synchrotron radiation instrumentation, San Francisco, CA (United States), 25-29 Aug 2003; Other Information: DOI: 10.1063/1.1757818; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BEAM OPTICS
BERYLLIUM
EQUIPMENT
IMAGES
ROUGHNESS
SPRING-8 STORAGE RING
SURFACES
TOPOGRAPHY
TRANSMISSION
X-RAY DIFFRACTION