Simultaneous Multimode Measurements of XAFS Spectra in the Soft X-ray Region
- Department of Photonics, Faculty of Science and Engineering, Ritsumeikan University, Kusatsu, Shiga 525-8577 (Japan)
A soft X-ray spectroscopy system has been constructed at the Synchrotron Radiation Center at Ritsumeikan University in which XAFS spectra in different modes, total electron yield, fluorescence yield and transmission, can be obtained simultaneously. It not only shortens total measurement time but also allows to make direct comparison of the spectra from the same sample area containing somewhat different information on the atomic and electronic structure of sample material. Spectra of silicon dioxide deposited on the silicon substrate and those of sodium thiosulfate are shown as examples. Discussion is given on the possibility of the use of the system for investigating absorption mechanism in sample material.
- OSTI ID:
- 20652800
- Journal Information:
- AIP Conference Proceedings, Vol. 705, Issue 1; Conference: 8. international conference on synchrotron radiation instrumentation, San Francisco, CA (United States), 25-29 Aug 2003; Other Information: DOI: 10.1063/1.1757977; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ABSORPTION
ABSORPTION SPECTROSCOPY
COMPARATIVE EVALUATIONS
ELECTRONIC STRUCTURE
ELECTRONS
FINE STRUCTURE
FLUORESCENCE
FLUORESCENCE SPECTROSCOPY
SILICON
SILICON OXIDES
SODIUM SULFATES
SOFT X RADIATION
SUBSTRATES
SYNCHROTRON RADIATION
TRANSMISSION
X-RAY SPECTRA
X-RAY SPECTROSCOPY