Temporally resolved Schwarzschild microscope for the characterization of extreme ultraviolet emission in laser-produced plasmas

Journal Article · Wed Dec 01 00:00:00 EST 2004 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.1818891· OSTI ID:20644037

Tao, Y; Nakai, M; Nishimura, H; Fujioka, S; Okuno, T; Fujiwara, T; Ueda, N; Miyanaga, N; Izawa, Y ^[1]

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1. Institute of Laser Engineering, Osaka University, 2-6 Yamada-oka, Suita, Osaka 565-0871 (Japan)

A temporally resolved monochromatic extreme ultraviolet (EUV) imager has been developed for use in EUV radiation source research. The imager consists of a Schwarzschild microscope, with near-normal-incident Mo/Si multilayer mirrors adjusted for 13.5 nm and 4% bandwidth, and an x-ray streak camera (XSC). The spatial resolution of the microscope was limited by the image detector's resolution to 3.5 {mu}m for the CCD camera and 15 {mu}m for the XSC, respectively, for a field of view of 1.2 mm. With the high photon collection efficiency, clear streak images could be obtained on a single-shot basis with laser pulse energy as low as 50 mJ at an intensity of 1x10{sup 10} W/cm{sup 2}. Expansion behavior of the EUV emission region was successfully observed for laser-produced Sn plasmas.

• OSTI ID: 20644037
• Journal Information: Review of Scientific Instruments, Vol. 75, Issue 12; Other Information: DOI: 10.1063/1.1818891; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHARGE-COUPLED DEVICES
EXTREME ULTRAVIOLET RADIATION
IMAGES
LASER-PRODUCED PLASMA
MONOCHROMATIC RADIATION
OPTICAL MICROSCOPES
PLASMA DIAGNOSTICS
PULSES
RADIATION SOURCES
SPATIAL RESOLUTION
STREAK CAMERAS