X-ray detection by direct modulation of an optical probe beam-Radsensor: Progress on development for imaging applications
- Lawrence Livermore National Laboratory, P.O. Box 808, Livermore, California 94551 (United States)
We present a progress report on our new x-ray detection technique based on optical measurement of the effects of x-ray absorption and electron hole pair creation in a direct band-gap semiconductor. The electron-hole pairs create a frequency dependent shift in optical refractive index and absorption. This is sensed by simultaneously directing an optical probe beam through the same volume of semiconducting medium that has experienced an x-ray induced modulation in the electron-hole population. If the wavelength of the optical probe beam is close to the semiconductor band-edge, the optical probe will be modulated significantly in phase and amplitude. We have analyzed the physics of the imaging radsensor, developed modeling tools for device design, and are cautiously optimistic that we will achieve single x-ray photon sensitivity, and picosecond response. These predictions will be tested with Cu K{alpha} xrays at the LLNL USP facility this spring and summer, with a cavity-based radsensor detector suitable for use in x-ray imagers.
- OSTI ID:
- 20641213
- Journal Information:
- Review of Scientific Instruments, Vol. 75, Issue 10; Conference: 15. topical conference on high temperature plasma diagnostics, San Diego, CA (United States), 19-22 Apr 2004; Other Information: DOI: 10.1063/1.1790055; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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