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Title: X-ray detection by direct modulation of an optical probe beam-Radsensor: Progress on development for imaging applications

Abstract

We present a progress report on our new x-ray detection technique based on optical measurement of the effects of x-ray absorption and electron hole pair creation in a direct band-gap semiconductor. The electron-hole pairs create a frequency dependent shift in optical refractive index and absorption. This is sensed by simultaneously directing an optical probe beam through the same volume of semiconducting medium that has experienced an x-ray induced modulation in the electron-hole population. If the wavelength of the optical probe beam is close to the semiconductor band-edge, the optical probe will be modulated significantly in phase and amplitude. We have analyzed the physics of the imaging radsensor, developed modeling tools for device design, and are cautiously optimistic that we will achieve single x-ray photon sensitivity, and picosecond response. These predictions will be tested with Cu K{alpha} xrays at the LLNL USP facility this spring and summer, with a cavity-based radsensor detector suitable for use in x-ray imagers.

Authors:
; ; ; ; ; ; ;  [1]
  1. Lawrence Livermore National Laboratory, P.O. Box 808, Livermore, California 94551 (United States)
Publication Date:
OSTI Identifier:
20641213
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 75; Journal Issue: 10; Conference: 15. topical conference on high temperature plasma diagnostics, San Diego, CA (United States), 19-22 Apr 2004; Other Information: DOI: 10.1063/1.1790055; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; AMPLITUDES; ENERGY ABSORPTION; FREQUENCY DEPENDENCE; GALLIUM ARSENIDES; HOLES; MODULATION; NONLINEAR OPTICS; OPTICAL PUMPING; PAIR PRODUCTION; REFRACTIVE INDEX; SEMICONDUCTOR MATERIALS; X-RAY DETECTION

Citation Formats

Lowry, Mark E, Bennett, Corey V, Vernon, Stephen P, Stewart, Richard, Welty, Rebecca J, Heebner, John, Landen, Otto L, and Bell, Perry M. X-ray detection by direct modulation of an optical probe beam-Radsensor: Progress on development for imaging applications. United States: N. p., 2004. Web. doi:10.1063/1.1790055.
Lowry, Mark E, Bennett, Corey V, Vernon, Stephen P, Stewart, Richard, Welty, Rebecca J, Heebner, John, Landen, Otto L, & Bell, Perry M. X-ray detection by direct modulation of an optical probe beam-Radsensor: Progress on development for imaging applications. United States. doi:10.1063/1.1790055.
Lowry, Mark E, Bennett, Corey V, Vernon, Stephen P, Stewart, Richard, Welty, Rebecca J, Heebner, John, Landen, Otto L, and Bell, Perry M. Fri . "X-ray detection by direct modulation of an optical probe beam-Radsensor: Progress on development for imaging applications". United States. doi:10.1063/1.1790055.
@article{osti_20641213,
title = {X-ray detection by direct modulation of an optical probe beam-Radsensor: Progress on development for imaging applications},
author = {Lowry, Mark E and Bennett, Corey V and Vernon, Stephen P and Stewart, Richard and Welty, Rebecca J and Heebner, John and Landen, Otto L and Bell, Perry M},
abstractNote = {We present a progress report on our new x-ray detection technique based on optical measurement of the effects of x-ray absorption and electron hole pair creation in a direct band-gap semiconductor. The electron-hole pairs create a frequency dependent shift in optical refractive index and absorption. This is sensed by simultaneously directing an optical probe beam through the same volume of semiconducting medium that has experienced an x-ray induced modulation in the electron-hole population. If the wavelength of the optical probe beam is close to the semiconductor band-edge, the optical probe will be modulated significantly in phase and amplitude. We have analyzed the physics of the imaging radsensor, developed modeling tools for device design, and are cautiously optimistic that we will achieve single x-ray photon sensitivity, and picosecond response. These predictions will be tested with Cu K{alpha} xrays at the LLNL USP facility this spring and summer, with a cavity-based radsensor detector suitable for use in x-ray imagers.},
doi = {10.1063/1.1790055},
journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 10,
volume = 75,
place = {United States},
year = {2004},
month = {10}
}