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Title: Triple junction motion and grain microstructure evolution

Journal Article · · Acta Materialia
 [1];  [1];  [1]
  1. Institut fuer Metallkunde und Metallphysik, RWTH Aachen, Kopernikusstr. 14, D-52056 Aachen (Germany)

The classical concepts of grain growth in polycrystals are based on the dominant role of grain boundaries. This is reflected by the well known von Neumann-Mullins relation. According to this approach triple junctions do not affect grain boundary motion, and their role in grain growth is reduced to maintaining the thermodynamically prescribed equilibrium angles at the lines where boundaries meet. In the current study the experimental data of triple junction mobility are considered with respect to the process of grain growth in 2D systems, in particular with regard to the controlling kinetics. When boundary kinetics prevails grain growth in a polycrystal complies with the von Neumann-Mullins relation. When grain growth is governed by the mobility of triple junctions the kinetics change, and the von Neumann-Mullins relation does not hold anymore. This is the more pronounced the smaller the triple junction mobility. We present a generalized theory of 2D grain growth including a limited triple junction mobility. In this concept the criterion {lambda} plays a central role. It reflects the ratio of boundary to triple junction mobility but is proportional to the grain size as well. The generalized von Neumann-Mullins relation can be expressed in terms of {lambda}. For small values of {lambda}, conspicuous changes of microstructure evolution during grain growth and of microstructural stability are predicted. The theoretical predictions are compared to results of computer simulations by a virtual vertex model.

OSTI ID:
20637170
Journal Information:
Acta Materialia, Vol. 53, Issue 5; Other Information: DOI: 10.1016/j.actamat.2004.12.006; PII: S1359-6454(04)00742-6; Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 1359-6454
Country of Publication:
United States
Language:
English