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Title: Characterization of CsI photocathodes at grazing incidence for use in a unit quantum efficiency x-ray streak camera

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1790558· OSTI ID:20636615
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  1. Experimental Systems Group, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, California 94720 (United States)

The performance of CsI photocathodes has been characterized for use with grazing incidence soft x rays. The total electron yield and pulsed quantum efficiency of a CsI photocathode has been measured in a reflection geometry as a function of photon energy (100 eV to 1 keV), angle of incidence, and the electric field between the anode and photocathode. The total electron yield and pulsed quantum efficiency increase as the x-ray penetration depth approaches the secondary electron escape depth. Unit quantum efficiency in a grazing incidence geometry is demonstrated. A weak electric-field dependence is observed for the total yield measurements; while no significant dependence is found for the pulsed quantum efficiency. The effect of the pulse height distribution on the detective quantum efficiency is discussed. Theoretical predictions agree accurately with experiment.

OSTI ID:
20636615
Journal Information:
Review of Scientific Instruments, Vol. 75, Issue 10; Other Information: DOI: 10.1063/1.1790558; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
Country of Publication:
United States
Language:
English