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Title: Exploiting quantum parallelism of entanglement for a complete experimental quantum characterization of a single-qubit device

Journal Article · · Physical Review. A
; ; ;  [1]
  1. Istituto Nazionale per la Fisica della Materia, Dipartimento di Fisica, Universita 'La Sapienza', Rome 00185 (Italy)

We present the full experimental quantum tomographic characterization of a single-qubit device achieved with a single entangled input state. The entangled input state plays the role of all possible input states in quantum parallel on the tested device. The method can be trivially extended to any n-qubit device by just replicating the whole experimental setup n times.

OSTI ID:
20636534
Journal Information:
Physical Review. A, Vol. 67, Issue 6; Other Information: DOI: 10.1103/PhysRevA.67.062307; (c) 2003 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1050-2947
Country of Publication:
United States
Language:
English