Direct observation of deformation-induced grain growth during the nanoindentation of ultrafine-grained Al at room temperature

Journal Article · Mon Oct 18 00:00:00 EDT 2004 · Acta Materialia

DOI:https://doi.org/10.1016/j.actamat.2004.07.044· OSTI ID:20634795

Jin, M ^[1]; Minor, A M ^[2]; Stach, E A ^[2]; Morris, J W ^[1]

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1. Department of Materials Science and Engineering, University of California, 228 Hearst Memorial Mining Building, Berkeley, CA 94701 (United States)
2. National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, One Cyclotron Road, MS 72, Berkeley, CA 94720 (United States)

In situ nanoindentation within a transmission electron microscope is used to investigate the deformation mechanisms in ultrafine-grained Al films. Deformation-induced grain growth resulting from grain boundary migration, grain rotation and grain coalescence is commonly observed as the indentation proceeds. In situ studies of nanograined films suggest that the same mechanisms are operative, though the difficulty of imaging nanosized grains makes the evidence less clear. The results suggest that grain growth and coalescence are important modes of response in the deformation of ultrafine- and nanograined materials.

• OSTI ID: 20634795
• Journal Information: Acta Materialia, Vol. 52, Issue 18; Other Information: DOI: 10.1016/j.actamat.2004.07.044; PII: S1359-6454(04)00465-3; Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 1359-6454
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ALUMINIUM
COALESCENCE
DEFORMATION
FILMS
GRAIN BOUNDARIES
GRAIN GROWTH
NANOSTRUCTURES
TEMPERATURE RANGE 0273-0400 K
TRANSMISSION ELECTRON MICROSCOPY