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Title: Microreflectivity characterization of the two-dimensional refractive index distribution of electron-beam-written optical waveguides in germanium-doped flame-hydrolysis silica

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.1784541· OSTI ID:20632737
; ; ;  [1]
  1. Department of Electrical and Computer Engineering, University of Toronto, Toronto, MSS 3G4 (Canada)

In this letter, we report on the detailed refractive index distribution of optical waveguides induced by electron-beam irradiation of Ge-doped flame hydrolysis silica and its variation with dose. The characterization was performed using microreflectivity measurements.

OSTI ID:
20632737
Journal Information:
Applied Physics Letters, Vol. 85, Issue 8; Other Information: DOI: 10.1063/1.1784541; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English