Structural anisotropy of magnetically aligned single wall carbon nanotube films

Journal Article · Mon Jul 31 00:00:00 EDT 2000 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.127078· OSTI ID:20217163

Smith, B W ^[1]; Benes, Z ^[1]; Luzzi, D E ^[1]; Fischer, J E ^[1]; Walters, D A ^[2]; Casavant, M J ^[2]; Schmidt, J ^[2]; Smalley, R E ^[2]

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1. Department of Materials Science and Engineering and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, Pennsylvania 19104 (United States)
2. Center for Nanoscale Science and Technology, Rice University, Houston, Texas 77259 (United States)

Thick films of aligned single wall carbon nanotubes and ropes have been produced by filtration/deposition from suspension in strong magnetic fields. We measured mosaic distributions of rope orientations in the film plane, for samples of different thicknesses. For an {approx}1 {mu}m film the full width at half maximum (FWHM) derived from electron diffraction is 25 degree sign -28 degree sign . The FWHM of a thicker film ({approx}7 {mu}m) measured by x-ray diffraction is slightly broader, 35{+-}3 degree sign . Aligned films are denser than ordinary filter-deposited ones, and much denser than as-grown material. Optimization of the process is expected to yield smaller FWHMs and higher densities. (c) 2000 American Institute of Physics.

• OSTI ID: 20217163
• Journal Information: Applied Physics Letters, Vol. 77, Issue 5; Other Information: PBD: 31 Jul 2000; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CARBON
THICKNESS
FILMS
DEPOSITION
ELECTRON DIFFRACTION
STRUCTURAL CHEMICAL ANALYSIS
X-RAY DIFFRACTION
EXPERIMENTAL DATA