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Title: Characterizing the hard x-ray diffraction properties of a GaAs linear Bragg-Fresnel lens

Abstract

We investigated the diffractive focusing properties of (111) GaAs linear Bragg-Fresnel lenses (BFLs) developed for hard x-ray microscopy and microdiffraction of complex materials in confined geometries. We demonstrated that the use of GaAs yields significant processing advantages due to the reduced zone depth. Focal plane diffraction patterns of linear BFLs measured at the advanced photon source using 8-40 keV x rays were compared to a simple model based on Kirchhoff-Fresnel diffraction theory. Good agreement was obtained between experimental data and model calculations using only zones within an effective aperture defined by the transverse coherence of the source. (c) 2000 American Institute of Physics.

Authors:
 [1];  [1];  [1];  [1];  [2];  [2];  [3]
  1. Materials Research Laboratory, Materials and Physics Departments, University of California, Santa Barbara, California 93106 (United States)
  2. Electrical and Computer Engineering Department and National Nanofabrication Users Network (NNUN), University of California, Santa Barbara, California 93106 (United States)
  3. The Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
Publication Date:
OSTI Identifier:
20217001
Resource Type:
Journal Article
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 77; Journal Issue: 3; Other Information: PBD: 17 Jul 2000; Journal ID: ISSN 0003-6951
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; GALLIUM ARSENIDES; HARD X RADIATION; FRESNEL LENS; BRAGG REFLECTION; X-RAY DIFFRACTION; MICROSCOPY; EXPERIMENTAL DATA

Citation Formats

Li, Youli, Wong, Gerard C. L., Case, Ryan, Safinya, Cyrus R, Caine, Ernie, Hu, Evelyn, and Fernandez, Partricia. Characterizing the hard x-ray diffraction properties of a GaAs linear Bragg-Fresnel lens. United States: N. p., 2000. Web. doi:10.1063/1.126961.
Li, Youli, Wong, Gerard C. L., Case, Ryan, Safinya, Cyrus R, Caine, Ernie, Hu, Evelyn, & Fernandez, Partricia. Characterizing the hard x-ray diffraction properties of a GaAs linear Bragg-Fresnel lens. United States. https://doi.org/10.1063/1.126961
Li, Youli, Wong, Gerard C. L., Case, Ryan, Safinya, Cyrus R, Caine, Ernie, Hu, Evelyn, and Fernandez, Partricia. Mon . "Characterizing the hard x-ray diffraction properties of a GaAs linear Bragg-Fresnel lens". United States. https://doi.org/10.1063/1.126961.
@article{osti_20217001,
title = {Characterizing the hard x-ray diffraction properties of a GaAs linear Bragg-Fresnel lens},
author = {Li, Youli and Wong, Gerard C. L. and Case, Ryan and Safinya, Cyrus R and Caine, Ernie and Hu, Evelyn and Fernandez, Partricia},
abstractNote = {We investigated the diffractive focusing properties of (111) GaAs linear Bragg-Fresnel lenses (BFLs) developed for hard x-ray microscopy and microdiffraction of complex materials in confined geometries. We demonstrated that the use of GaAs yields significant processing advantages due to the reduced zone depth. Focal plane diffraction patterns of linear BFLs measured at the advanced photon source using 8-40 keV x rays were compared to a simple model based on Kirchhoff-Fresnel diffraction theory. Good agreement was obtained between experimental data and model calculations using only zones within an effective aperture defined by the transverse coherence of the source. (c) 2000 American Institute of Physics.},
doi = {10.1063/1.126961},
url = {https://www.osti.gov/biblio/20217001}, journal = {Applied Physics Letters},
issn = {0003-6951},
number = 3,
volume = 77,
place = {United States},
year = {2000},
month = {7}
}