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Title: The microstructure of continuously processed YBa{sub 2}Cu{sub 3}O{sub y} coated conductors with underlying CeO{sub 2} and ion-beam-assisted yttria-stabilized zirconia buffer layers

Abstract

The microstructural development of YBa{sub 2}Cu{sub 3}O{sub y} (Y-123) coated conductors based on the ion-beam-assisted deposition (IBAD) of yttria-stabilized zirconia (YSZ) to produce a biaxially textured template is presented. The architecture of the conductors was Y-123/CeO{sub 2}/IBAD YSZ/Inconel 625. A continuous and passivating Cr{sub 2}O{sub 3} layer forms between the YSZ layer and the Inconel substrate. CeO{sub 2} and Y-123 are closely lattice-matched, and misfit strain is accommodated at the YSZ/CeO{sub 2} interface. Localized reactions between the Y-123 film and the CeO{sub 2} buffer layer result in the formation of BaCeO{sub 3}, YCuO{sub 2}, and CuO. The positive volume change that occurs from the interfacial reaction may act as a kinetic barrier that limits the extent of the reaction. Excess copper and yttrium generated by the interfacial reaction appear to diffuse along grain boundaries and intercalate into Y-123 grains as single layers of the Y-247, Y-248, or Y-224 phases. The interfacial reactions do not preclude the attainment of high critical currents (I{sub c}) and current densities (J{sub c}) in these films nor do they affect to any appreciable extent the nucleation and alignment of the Y-123 film. (c) 2000 Materials Research Society.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1]
  1. Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
Publication Date:
OSTI Identifier:
20216862
Resource Type:
Journal Article
Journal Name:
Journal of Materials Research
Additional Journal Information:
Journal Volume: 15; Journal Issue: 5; Other Information: PBD: May 2000; Journal ID: ISSN 0884-2914
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 24 POWER TRANSMISSION AND DISTRIBUTION; SUPERCONDUCTING COMPOSITES; SUPERCONDUCTING FILMS; HIGH-TC SUPERCONDUCTORS; YTTRIUM OXIDES; BARIUM OXIDES; COPPER OXIDES; CERIUM OXIDES; ZIRCONIUM OXIDES; INCONEL 625; COATINGS; PHYSICAL VAPOR DEPOSITION; INTERFACES; MICROSTRUCTURE; TEXTURE; CRITICAL CURRENT; EXPERIMENTAL DATA

Citation Formats

Holesinger, T. G., Foltyn, S. R., Arendt, P. N., Kung, H., Jia, Q. X., Dickerson, R. M., Dowden, P. C., DePaula, R. F., Groves, J. R., and Coulter, J. Y. The microstructure of continuously processed YBa{sub 2}Cu{sub 3}O{sub y} coated conductors with underlying CeO{sub 2} and ion-beam-assisted yttria-stabilized zirconia buffer layers. United States: N. p., 2000. Web. doi:10.1557/JMR.2000.0158.
Holesinger, T. G., Foltyn, S. R., Arendt, P. N., Kung, H., Jia, Q. X., Dickerson, R. M., Dowden, P. C., DePaula, R. F., Groves, J. R., & Coulter, J. Y. The microstructure of continuously processed YBa{sub 2}Cu{sub 3}O{sub y} coated conductors with underlying CeO{sub 2} and ion-beam-assisted yttria-stabilized zirconia buffer layers. United States. doi:10.1557/JMR.2000.0158.
Holesinger, T. G., Foltyn, S. R., Arendt, P. N., Kung, H., Jia, Q. X., Dickerson, R. M., Dowden, P. C., DePaula, R. F., Groves, J. R., and Coulter, J. Y. Mon . "The microstructure of continuously processed YBa{sub 2}Cu{sub 3}O{sub y} coated conductors with underlying CeO{sub 2} and ion-beam-assisted yttria-stabilized zirconia buffer layers". United States. doi:10.1557/JMR.2000.0158.
@article{osti_20216862,
title = {The microstructure of continuously processed YBa{sub 2}Cu{sub 3}O{sub y} coated conductors with underlying CeO{sub 2} and ion-beam-assisted yttria-stabilized zirconia buffer layers},
author = {Holesinger, T. G. and Foltyn, S. R. and Arendt, P. N. and Kung, H. and Jia, Q. X. and Dickerson, R. M. and Dowden, P. C. and DePaula, R. F. and Groves, J. R. and Coulter, J. Y.},
abstractNote = {The microstructural development of YBa{sub 2}Cu{sub 3}O{sub y} (Y-123) coated conductors based on the ion-beam-assisted deposition (IBAD) of yttria-stabilized zirconia (YSZ) to produce a biaxially textured template is presented. The architecture of the conductors was Y-123/CeO{sub 2}/IBAD YSZ/Inconel 625. A continuous and passivating Cr{sub 2}O{sub 3} layer forms between the YSZ layer and the Inconel substrate. CeO{sub 2} and Y-123 are closely lattice-matched, and misfit strain is accommodated at the YSZ/CeO{sub 2} interface. Localized reactions between the Y-123 film and the CeO{sub 2} buffer layer result in the formation of BaCeO{sub 3}, YCuO{sub 2}, and CuO. The positive volume change that occurs from the interfacial reaction may act as a kinetic barrier that limits the extent of the reaction. Excess copper and yttrium generated by the interfacial reaction appear to diffuse along grain boundaries and intercalate into Y-123 grains as single layers of the Y-247, Y-248, or Y-224 phases. The interfacial reactions do not preclude the attainment of high critical currents (I{sub c}) and current densities (J{sub c}) in these films nor do they affect to any appreciable extent the nucleation and alignment of the Y-123 film. (c) 2000 Materials Research Society.},
doi = {10.1557/JMR.2000.0158},
journal = {Journal of Materials Research},
issn = {0884-2914},
number = 5,
volume = 15,
place = {United States},
year = {2000},
month = {5}
}