Characterization of a microfocused circularly polarized x-ray probe

Journal Article · Thu Jun 01 00:00:00 EDT 2000 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.1150625· OSTI ID:20216623

Pollmann, J ^[1]; Srajer, G ^[1]; Maser, J ^[1]; Lang, J C ^[1]; Nelson, C S ^[1]; Venkataraman, C T ^[1]; Isaacs, E D ^[2]

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1. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
2. Bell Laboratories, Lucent Technologies, Murray Hill, New Jersey 07974 (United States)

We report on the development of a circularly polarized x-ray microprobe in the intermediate energy range from 5 to 10 keV. In this experiment linearly polarized synchrotron radiation was circularly polarized by means of a Bragg-diffracting diamond phase retarder and subsequently focused down to a spot size of about 4x2 {mu}m{sup 2} by a Fresnel zone plate. The properties of the microprobe were characterized, and the technique was applied to the two-dimensional mapping of magnetic domains in HoFe{sub 2}. (c) 2000 American Institute of Physics.

• OSTI ID: 20216623
• Journal Information: Review of Scientific Instruments, Vol. 71, Issue 6; Other Information: PBD: Jun 2000; ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
KEV RANGE 01-10
BRAGG REFLECTION
X-RAY DIFFRACTION
X-RAY EQUIPMENT
HOLMIUM FLUORIDES
POLARIZATION
EXPERIMENTAL DATA