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Title: Electric-Field-Induced Soft-Mode Hardening in SrTiO{sub 3} Films

Abstract

We have studied electric-field-induced Raman scattering in SrTiO{sub 3} thin films using an indium-tin- oxide/SrTiO {sub 3}/SrRuO {sub 3} structure grown by pulsed laser deposition. The soft mode polarized along the field becomes Raman active. Experimental data for electric-field-induced hardening of the soft modes and the tuning of the static dielectric constant are in agreement described by the Lyddane-Sachs-Teller formalism. The markedly different behavior of the soft modes in thin films from that in the bulk is explained by the existence of local polar regions. (c) 2000 The American Physical Society.

Authors:
; ; ; ;
Publication Date:
OSTI Identifier:
20216592
Resource Type:
Journal Article
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Volume: 84; Journal Issue: 20; Other Information: PBD: 15 May 2000; Journal ID: ISSN 0031-9007
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; STRONTIUM OXIDES; TITANATES; ELECTRIC FIELDS; FERROELECTRIC MATERIALS; RAMAN SPECTRA; THIN FILMS; DIELECTRIC TENSOR; PHONONS; EXPERIMENTAL DATA

Citation Formats

Akimov, I. A., Sirenko, A. A., Clark, A. M., Hao, J.-H., and Xi, X. X. Electric-Field-Induced Soft-Mode Hardening in SrTiO{sub 3} Films. United States: N. p., 2000. Web. doi:10.1103/PhysRevLett.84.4625.
Akimov, I. A., Sirenko, A. A., Clark, A. M., Hao, J.-H., & Xi, X. X. Electric-Field-Induced Soft-Mode Hardening in SrTiO{sub 3} Films. United States. doi:10.1103/PhysRevLett.84.4625.
Akimov, I. A., Sirenko, A. A., Clark, A. M., Hao, J.-H., and Xi, X. X. Mon . "Electric-Field-Induced Soft-Mode Hardening in SrTiO{sub 3} Films". United States. doi:10.1103/PhysRevLett.84.4625.
@article{osti_20216592,
title = {Electric-Field-Induced Soft-Mode Hardening in SrTiO{sub 3} Films},
author = {Akimov, I. A. and Sirenko, A. A. and Clark, A. M. and Hao, J.-H. and Xi, X. X.},
abstractNote = {We have studied electric-field-induced Raman scattering in SrTiO{sub 3} thin films using an indium-tin- oxide/SrTiO {sub 3}/SrRuO {sub 3} structure grown by pulsed laser deposition. The soft mode polarized along the field becomes Raman active. Experimental data for electric-field-induced hardening of the soft modes and the tuning of the static dielectric constant are in agreement described by the Lyddane-Sachs-Teller formalism. The markedly different behavior of the soft modes in thin films from that in the bulk is explained by the existence of local polar regions. (c) 2000 The American Physical Society.},
doi = {10.1103/PhysRevLett.84.4625},
journal = {Physical Review Letters},
issn = {0031-9007},
number = 20,
volume = 84,
place = {United States},
year = {2000},
month = {5}
}