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Title: Structural Phase Transition of Aluminum Induced by Electronic Excitation

Abstract

The dynamics of a structural phase transition induced by interband electronic excitation in aluminum is studied by determining the time evolution of the dielectric constant at 1.55 eV through the measurement of the transient reflectivity induced by an ultrafast pump pulse. The threshold fluence and the time scale for this transition are significantly less than the values necessary for ultrafast heat-induced melting, indicating that this phase change is caused by band structure collapse and lattice instability resulting from strong electronic excitation. (c) 2000 The American Physical Society.

Authors:
; ; ;
Publication Date:
OSTI Identifier:
20216444
Resource Type:
Journal Article
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Volume: 84; Journal Issue: 19; Other Information: PBD: 8 May 2000; Journal ID: ISSN 0031-9007
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ALUMINIUM; PHASE TRANSFORMATIONS; DIELECTRIC TENSOR; REFLECTIVITY; CRYSTAL STRUCTURE; HARMONIC GENERATION; LASER RADIATION; ELECTRONIC STRUCTURE; EXCITATION; TIME DEPENDENCE; EXPERIMENTAL DATA

Citation Formats

Guo, C., Rodriguez, G., Lobad, A., and Taylor, A. J. Structural Phase Transition of Aluminum Induced by Electronic Excitation. United States: N. p., 2000. Web. doi:10.1103/PhysRevLett.84.4493.
Guo, C., Rodriguez, G., Lobad, A., & Taylor, A. J. Structural Phase Transition of Aluminum Induced by Electronic Excitation. United States. doi:10.1103/PhysRevLett.84.4493.
Guo, C., Rodriguez, G., Lobad, A., and Taylor, A. J. Mon . "Structural Phase Transition of Aluminum Induced by Electronic Excitation". United States. doi:10.1103/PhysRevLett.84.4493.
@article{osti_20216444,
title = {Structural Phase Transition of Aluminum Induced by Electronic Excitation},
author = {Guo, C. and Rodriguez, G. and Lobad, A. and Taylor, A. J.},
abstractNote = {The dynamics of a structural phase transition induced by interband electronic excitation in aluminum is studied by determining the time evolution of the dielectric constant at 1.55 eV through the measurement of the transient reflectivity induced by an ultrafast pump pulse. The threshold fluence and the time scale for this transition are significantly less than the values necessary for ultrafast heat-induced melting, indicating that this phase change is caused by band structure collapse and lattice instability resulting from strong electronic excitation. (c) 2000 The American Physical Society.},
doi = {10.1103/PhysRevLett.84.4493},
journal = {Physical Review Letters},
issn = {0031-9007},
number = 19,
volume = 84,
place = {United States},
year = {2000},
month = {5}
}