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Title: Magnetic domain and domain-wall imaging of submicron Co dots by probing the magnetostrictive response using atomic force microscopy

Abstract

An approach to image the domains and domain walls of small ferromagnetic entities using atomic force microscopy (AFM), with a nonmagnetic AFM probe, has been developed. Exciting the sample in an external ac magnetic field, the distribution of magnetostrictive response at the surface is detected. By this technique, the domains and domain walls of submicron Co dots have been imaged with a 1 nm lateral resolution. In elliptical Co dots with a 350-nm-long axis on a triangular lattice array with 400 nm periodicity, we find evidence for two domains with opposite magnetization orientation across a wall. The domain-wall width in these dots is found to be about 35 nm. Furthermore, we observe a ferromagnetic alignment of the domains in the neighboring dots, which suggests a magnetostatic interaction among the dots. (c) 2000 American Institute of Physics.

Authors:
 [1];  [1];  [2];  [3]
  1. Department of Materials Science, Royal Institute of Technology, SE-10044 Stockholm, (Sweden)
  2. Departament de Fisica, Universitat Autonoma de Barcelona, 08193 Bellaterra (Barcelona), (Spain)
  3. Physics Department, University of California-San Diego, La Jolla, California 92093-0319 (United States)
Publication Date:
OSTI Identifier:
20216361
Resource Type:
Journal Article
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 76; Journal Issue: 20; Other Information: PBD: 15 May 2000; Journal ID: ISSN 0003-6951
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; COBALT; DOMAIN STRUCTURE; IMAGES; MICROSCOPY; MAGNETOSTRICTION; FERROMAGNETIC MATERIALS; MAGNETIZATION; EXPERIMENTAL DATA

Citation Formats

Wittborn, J, Rao, K V, Nogues, J, and Schuller, Ivan K. Magnetic domain and domain-wall imaging of submicron Co dots by probing the magnetostrictive response using atomic force microscopy. United States: N. p., 2000. Web. doi:10.1063/1.126520.
Wittborn, J, Rao, K V, Nogues, J, & Schuller, Ivan K. Magnetic domain and domain-wall imaging of submicron Co dots by probing the magnetostrictive response using atomic force microscopy. United States. https://doi.org/10.1063/1.126520
Wittborn, J, Rao, K V, Nogues, J, and Schuller, Ivan K. 2000. "Magnetic domain and domain-wall imaging of submicron Co dots by probing the magnetostrictive response using atomic force microscopy". United States. https://doi.org/10.1063/1.126520.
@article{osti_20216361,
title = {Magnetic domain and domain-wall imaging of submicron Co dots by probing the magnetostrictive response using atomic force microscopy},
author = {Wittborn, J and Rao, K V and Nogues, J and Schuller, Ivan K},
abstractNote = {An approach to image the domains and domain walls of small ferromagnetic entities using atomic force microscopy (AFM), with a nonmagnetic AFM probe, has been developed. Exciting the sample in an external ac magnetic field, the distribution of magnetostrictive response at the surface is detected. By this technique, the domains and domain walls of submicron Co dots have been imaged with a 1 nm lateral resolution. In elliptical Co dots with a 350-nm-long axis on a triangular lattice array with 400 nm periodicity, we find evidence for two domains with opposite magnetization orientation across a wall. The domain-wall width in these dots is found to be about 35 nm. Furthermore, we observe a ferromagnetic alignment of the domains in the neighboring dots, which suggests a magnetostatic interaction among the dots. (c) 2000 American Institute of Physics.},
doi = {10.1063/1.126520},
url = {https://www.osti.gov/biblio/20216361}, journal = {Applied Physics Letters},
issn = {0003-6951},
number = 20,
volume = 76,
place = {United States},
year = {Mon May 15 00:00:00 EDT 2000},
month = {Mon May 15 00:00:00 EDT 2000}
}