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Title: Magnetic excitations in tetragonal HoCr{sub 2}Si{sub 2}

Abstract

Magnetic excitations in tetragonal HoCr{sub 2}Si{sub 2} have been measured by neutron spectroscopy. The temperature and Q dependence of the excitations measured at 8 K confirm that they can be attributed to crystal field (CF) dipolar transitions experienced by the Ho ion. The analysis of the neutron spectroscopy data for HoCr{sub 2}Si{sub 2} is simplified by the fact that the CF coefficients have already been determined for the series RX{sub 2}Si{sub 2} (R=rare earth, X=Cu, Ni) by neutron spectroscopy. In addition, electronic band structure calculations and experimental determinations of the electric field gradient for numerous compounds of the type RT{sub 2}Si{sub 2} (T=Cr, Cu, Ni) show that the first-order CF coefficient, A{sub 2}{sup 0}, changes sign when passing from the series RX{sub 2}Si{sub 2} (X=Cr, Ni) to RCu{sub 2}Si{sub 2}. In the light of this information, the available neutron spectroscopy data for HoCr{sub 2}Si{sub 2} are presented and discussed. (c) 2000 American Institute of Physics.

Authors:
 [1];  [2];  [2];  [3]
  1. INFM, Dipartimento di Fisica, Universita di Modena e Reggio Emilia, Via G. Campi 213/a, Modena, 41100, (Italy)
  2. Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60436-4845 (United States)
  3. Van der Waals-Zeeman Institute, University of Amsterdam, Valckenierstraat. 65, 1018 XE, Amsterdam, The Netherlands (Netherlands)
Publication Date:
OSTI Identifier:
20216268
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 87; Journal Issue: 9; Other Information: PBD: 1 May 2000; Journal ID: ISSN 0021-8979
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; HOLMIUM COMPOUNDS; CHROMIUM COMPOUNDS; SILICON COMPOUNDS; INTERMETALLIC COMPOUNDS; NEUTRON SPECTROSCOPY; ELECTRONIC STRUCTURE; MAGNETIC PROPERTIES; EXPERIMENTAL DATA; THEORETICAL DATA

Citation Formats

Moze, O., Rosenkranz, S., Osborn, R., and Buschow, K. H. J. Magnetic excitations in tetragonal HoCr{sub 2}Si{sub 2}. United States: N. p., 2000. Web. doi:10.1063/1.372680.
Moze, O., Rosenkranz, S., Osborn, R., & Buschow, K. H. J. Magnetic excitations in tetragonal HoCr{sub 2}Si{sub 2}. United States. doi:10.1063/1.372680.
Moze, O., Rosenkranz, S., Osborn, R., and Buschow, K. H. J. Mon . "Magnetic excitations in tetragonal HoCr{sub 2}Si{sub 2}". United States. doi:10.1063/1.372680.
@article{osti_20216268,
title = {Magnetic excitations in tetragonal HoCr{sub 2}Si{sub 2}},
author = {Moze, O. and Rosenkranz, S. and Osborn, R. and Buschow, K. H. J.},
abstractNote = {Magnetic excitations in tetragonal HoCr{sub 2}Si{sub 2} have been measured by neutron spectroscopy. The temperature and Q dependence of the excitations measured at 8 K confirm that they can be attributed to crystal field (CF) dipolar transitions experienced by the Ho ion. The analysis of the neutron spectroscopy data for HoCr{sub 2}Si{sub 2} is simplified by the fact that the CF coefficients have already been determined for the series RX{sub 2}Si{sub 2} (R=rare earth, X=Cu, Ni) by neutron spectroscopy. In addition, electronic band structure calculations and experimental determinations of the electric field gradient for numerous compounds of the type RT{sub 2}Si{sub 2} (T=Cr, Cu, Ni) show that the first-order CF coefficient, A{sub 2}{sup 0}, changes sign when passing from the series RX{sub 2}Si{sub 2} (X=Cr, Ni) to RCu{sub 2}Si{sub 2}. In the light of this information, the available neutron spectroscopy data for HoCr{sub 2}Si{sub 2} are presented and discussed. (c) 2000 American Institute of Physics.},
doi = {10.1063/1.372680},
journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 9,
volume = 87,
place = {United States},
year = {2000},
month = {5}
}