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Title: Analysis of x-ray reflectivity data from low-contrast polymer bilayer systems using a Fourier method

Abstract

X-ray reflectivity data of polymer bilayer systems have been analyzed using a Fourier method which takes into account different limits of integration in q-space. It is demonstrated that the interfacial parameters can be determined with high accuracy although the difference in the electron density (the contrast) of the two polymers is extremely small. This method is not restricted to soft-matter thin films. It can be applied to any reflectivity data from low-contrast layer systems. (c) 2000 American Institute of Physics.

Authors:
 [1];  [1];  [2];  [3];  [3];  [3];  [4]
  1. XFD/APS Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439 (United States)
  2. Institut fuer Experimentelle und Angewandte Physik der Universitaet Kiel, 24098 Kiel, (Germany)
  3. Department of Materials Science and Engineering, State University of New York at Stony Brook, Stony Brook, New York 11794-2275 (United States)
  4. Exxon Research and Engineering Company, Annadale, New Jersey 08801 (United States)
Publication Date:
OSTI Identifier:
20216183
Resource Type:
Journal Article
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 76; Journal Issue: 19; Other Information: PBD: 8 May 2000; Journal ID: ISSN 0003-6951
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; POLYMERS; X-RAY DIFFRACTION; FOURIER ANALYSIS; THIN FILMS; REFLECTIVITY; INTERFACES

Citation Formats

Seeck, O. H., Kaendler, I. D., Tolan, M., Shin, K., Rafailovich, M. H., Sokolov, J., and Kolb, R. Analysis of x-ray reflectivity data from low-contrast polymer bilayer systems using a Fourier method. United States: N. p., 2000. Web. doi:10.1063/1.126452.
Seeck, O. H., Kaendler, I. D., Tolan, M., Shin, K., Rafailovich, M. H., Sokolov, J., & Kolb, R. Analysis of x-ray reflectivity data from low-contrast polymer bilayer systems using a Fourier method. United States. doi:10.1063/1.126452.
Seeck, O. H., Kaendler, I. D., Tolan, M., Shin, K., Rafailovich, M. H., Sokolov, J., and Kolb, R. Mon . "Analysis of x-ray reflectivity data from low-contrast polymer bilayer systems using a Fourier method". United States. doi:10.1063/1.126452.
@article{osti_20216183,
title = {Analysis of x-ray reflectivity data from low-contrast polymer bilayer systems using a Fourier method},
author = {Seeck, O. H. and Kaendler, I. D. and Tolan, M. and Shin, K. and Rafailovich, M. H. and Sokolov, J. and Kolb, R.},
abstractNote = {X-ray reflectivity data of polymer bilayer systems have been analyzed using a Fourier method which takes into account different limits of integration in q-space. It is demonstrated that the interfacial parameters can be determined with high accuracy although the difference in the electron density (the contrast) of the two polymers is extremely small. This method is not restricted to soft-matter thin films. It can be applied to any reflectivity data from low-contrast layer systems. (c) 2000 American Institute of Physics.},
doi = {10.1063/1.126452},
journal = {Applied Physics Letters},
issn = {0003-6951},
number = 19,
volume = 76,
place = {United States},
year = {2000},
month = {5}
}