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Title: Single grain boundary characterization of Nb-doped SrTiO{sub 3} bicrystals using ac four-point impedance spectroscopy

Abstract

AC four-point impedance spectroscopy has been applied to Nb-doped SrTiO{sub 3} bicrystals. Due to the simplified geometry and highly conductive bulk of the bicrystal, the reference impedance of the electrode was significantly reduced, validating the applicability of ac four-point impedance spectroscopy for electroceramics. DC current-voltage characteristics without any interference due to electrodes confirmed these ac measurements. Using ac four-point impedance spectroscopy, grain boundary contributions are isolated and the corresponding grain boundary thickness and resistivity are estimated. (c) 2000 American Institute of Physics.

Authors:
 [1];  [1];  [1];  [1]
  1. Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208 (United States)
Publication Date:
OSTI Identifier:
20216181
Resource Type:
Journal Article
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 76; Journal Issue: 18; Other Information: PBD: 1 May 2000; Journal ID: ISSN 0003-6951
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; STRONTIUM OXIDES; TITANATES; DOPED MATERIALS; NIOBIUM ADDITIONS; GRAIN BOUNDARIES; BICRYSTALS; IMPEDANCE; ELECTRIC CONDUCTIVITY; EXPERIMENTAL DATA

Citation Formats

Hwang, Jin-Ha, Johnson, Kevin D., Mason, Thomas O., and Dravid, Vinayak P. Single grain boundary characterization of Nb-doped SrTiO{sub 3} bicrystals using ac four-point impedance spectroscopy. United States: N. p., 2000. Web. doi:10.1063/1.126428.
Hwang, Jin-Ha, Johnson, Kevin D., Mason, Thomas O., & Dravid, Vinayak P. Single grain boundary characterization of Nb-doped SrTiO{sub 3} bicrystals using ac four-point impedance spectroscopy. United States. doi:10.1063/1.126428.
Hwang, Jin-Ha, Johnson, Kevin D., Mason, Thomas O., and Dravid, Vinayak P. Mon . "Single grain boundary characterization of Nb-doped SrTiO{sub 3} bicrystals using ac four-point impedance spectroscopy". United States. doi:10.1063/1.126428.
@article{osti_20216181,
title = {Single grain boundary characterization of Nb-doped SrTiO{sub 3} bicrystals using ac four-point impedance spectroscopy},
author = {Hwang, Jin-Ha and Johnson, Kevin D. and Mason, Thomas O. and Dravid, Vinayak P.},
abstractNote = {AC four-point impedance spectroscopy has been applied to Nb-doped SrTiO{sub 3} bicrystals. Due to the simplified geometry and highly conductive bulk of the bicrystal, the reference impedance of the electrode was significantly reduced, validating the applicability of ac four-point impedance spectroscopy for electroceramics. DC current-voltage characteristics without any interference due to electrodes confirmed these ac measurements. Using ac four-point impedance spectroscopy, grain boundary contributions are isolated and the corresponding grain boundary thickness and resistivity are estimated. (c) 2000 American Institute of Physics.},
doi = {10.1063/1.126428},
journal = {Applied Physics Letters},
issn = {0003-6951},
number = 18,
volume = 76,
place = {United States},
year = {2000},
month = {5}
}