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Title: Connecting disorder and magnetic properties in CoFe thin films

Abstract

Through a direct study of the chemical and magnetic interfacial disorder in conjunction with magnetic property measurements, evidence is presented that the grain size is the ultimate factor in determining the magnetic coercivity in CoFe thin film structures. (c) 2000 American Institute of Physics.

Authors:
 [1];  [2];  [2]
  1. Experimental Facilities Division, Argonne National Laboratory, Argonne, Ilinois 60439 (United States)
  2. Materials Science Division, Naval Research Laboratory, Washington, D.C. 20375 (United States)
Publication Date:
OSTI Identifier:
20216180
Resource Type:
Journal Article
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 76; Journal Issue: 18; Other Information: PBD: 1 May 2000; Journal ID: ISSN 0003-6951
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; COBALT ALLOYS; IRON ALLOYS; THIN FILMS; GRAIN SIZE; COERCIVE FORCE; X-RAY DIFFRACTION; NSLS; RESONANCE SCATTERING; INTERFACES; MAGNETIC PROPERTIES; EXPERIMENTAL DATA

Citation Formats

Freeland, J. W., Bussmann, K., and Idzerda, Y. U. Connecting disorder and magnetic properties in CoFe thin films. United States: N. p., 2000. Web. doi:10.1063/1.126422.
Freeland, J. W., Bussmann, K., & Idzerda, Y. U. Connecting disorder and magnetic properties in CoFe thin films. United States. doi:10.1063/1.126422.
Freeland, J. W., Bussmann, K., and Idzerda, Y. U. Mon . "Connecting disorder and magnetic properties in CoFe thin films". United States. doi:10.1063/1.126422.
@article{osti_20216180,
title = {Connecting disorder and magnetic properties in CoFe thin films},
author = {Freeland, J. W. and Bussmann, K. and Idzerda, Y. U.},
abstractNote = {Through a direct study of the chemical and magnetic interfacial disorder in conjunction with magnetic property measurements, evidence is presented that the grain size is the ultimate factor in determining the magnetic coercivity in CoFe thin film structures. (c) 2000 American Institute of Physics.},
doi = {10.1063/1.126422},
journal = {Applied Physics Letters},
issn = {0003-6951},
number = 18,
volume = 76,
place = {United States},
year = {2000},
month = {5}
}