Nonlinear optical characterization of GaN layers grown by MOCVD on sapphire[Metal Organic Chemical Vapor Deposition]
Optical second and third harmonic generation measurements were carried out on GaN layers grown by metalorganic chemical vapor deposition (MOCVD) on sapphire substrates. The measured d{sub 33} is 33 times the d{sub 11} of quartz. The angular dependence of second-harmonic intensity as well as the measured ratios d{sub 33}/d{sub 15} = {minus}2.02 and d{sub 33}/d{sub 31} = {minus}2.03 confirm the wurzite structure of the studied GaN layers with the optical c-axis oriented perpendicular to the sample surface. Fine oscillations were observed in the measured second and third harmonic angular dependencies. A simple model based on the interference of the fundamental beam in the sample was used to explain these oscillations.
- Research Organization:
- Technical Univ. of Moldova, Chisinau (MD)
- OSTI ID:
- 20104619
- Resource Relation:
- Conference: 1999 Materials Research Society Fall Meeting, Boston, MA (US), 11/28/1999--12/03/1999; Other Information: PBD: 2000; Related Information: In: GaN and related alloys -- 1999. Materials Research Society symposium proceedings, Volume 595, by Myers, T.H.; Feenstra, R.M.; Shur, M.S.; Amano, Hiroshi [eds.], [1050] pages.
- Country of Publication:
- United States
- Language:
- English
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