A GaN-Based Active Power Decoupling Approach for Enhancing the Efficiency and Reliability of Residential PV Microinverters
It is a common sense that, the reliability of a system is dictated by the life-time of its weakest component. In terms of a single-phase solar photovoltaic (PV) system, including PV panel and the microinverter, the reliability of the system is confined by the electrolytic dc-link capacitor at the input of its microinverter. To enhance the reliability of the system by providing the possibility of employing film capacitors, with higher life-time rather than their electrolytic counterparts, this paper presents a novel modeling, design, and control of a PV-side active power decoupling (APD) approach. Besides, GaN FETs are employed to achieve a superior efficiency and power density of the APD. The proposed methodology is verified through a thorough design, loss modeling, and numerical analysis.
- Research Organization:
- Univ. of Maryland, College Park, MD (United States)
- Sponsoring Organization:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE)
- DOE Contract Number:
- EE0008350
- OSTI ID:
- 2007917
- Report Number(s):
- DOE-UMD-8350-8
- Journal Information:
- 2019 IEEE Energy Conversion Congress and Exposition (ECCE), Conference: 2019 IEEE Energy Conversion Congress and Exposition (ECCE), Baltimore, MD, USA
- Country of Publication:
- United States
- Language:
- English
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