Subgrain growth and low angle boundary mobility in aluminum crystals of orientation {l_brace}110{r_brace}<001>
Single crystals of orientation {l_brace}110{r_brace}<001> of a high purity Al-0.05% Si single-phase aluminum alloy have been deformed in channel die plane strain compression at room temperature and 350 C. The specimens were annealed at temperatures between 250 and 400 C and detailed measurements have been made of the extensive subgrain growth which occurs in these crystals. It was found that subgrain growth tended to be discontinuous, confirming earlier experimental and theoretical work, and showing that subgrain growth is quite different from normal grain growth. The mean misorientation between subgrains decreased during annealing and this was shown to have a strong effect on the kinetics of subgrain growth. The mobilities of low angle boundaries (2.6{degree} < {theta} < 5.6{degree}) at temperatures between 250 and 400 C were determined from the subgrain growth kinetics and the activation energies for migration found to be consistent with control by lattice diffusion of solute. The boundary mobilities were found to increase rapidly with increasing misorientation and the results have been compared with the predictions of current theories.
- Research Organization:
- Manchester Materials Science Center (GB)
- OSTI ID:
- 20075951
- Journal Information:
- Acta Materialia, Vol. 48, Issue 8; Other Information: PBD: 11 May 2000; ISSN 1359-6454
- Country of Publication:
- United States
- Language:
- English
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