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Title: Island grains of low misorientation angles formed during abnormal grain growth in Cu

Abstract

During abnormal grain growth (AGG) or secondary recrystallization, some small grains are entrapped in the growing large grains and become island grains. In this report, the authors describe the observations of island grains formed during annealing of pure Cu, their orientations determined by electron backscattered pattern (EBSP), and their shrinkage upon further annealing. They discuss the observations in terms of the dependence of the grain boundary migration on its structure.

Authors:
; ;
Publication Date:
Research Org.:
Korea Advanced Inst. of Science and Technology, Taejon (KR)
Sponsoring Org.:
Korea Ministry of Science and Technology
OSTI Identifier:
20075689
Alternate Identifier(s):
OSTI ID: 20075689
Resource Type:
Journal Article
Journal Name:
Metallurgical and Materials Transactions. A, Physical Metallurgy and Materials Science
Additional Journal Information:
Journal Volume: 31; Journal Issue: 5; Other Information: PBD: May 2000; Journal ID: ISSN 1073-5623
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; GRAIN GROWTH; COPPER; DEFORMATION; ANNEALING; RECRYSTALLIZATION; TEMPERATURE RANGE 1000-4000 K; GRAIN SIZE; GRAIN ORIENTATION; DATA

Citation Formats

Koo, J.B., Yoon, D.Y., and Henry, M.F. Island grains of low misorientation angles formed during abnormal grain growth in Cu. United States: N. p., 2000. Web. doi:10.1007/s11661-000-0267-z.
Koo, J.B., Yoon, D.Y., & Henry, M.F. Island grains of low misorientation angles formed during abnormal grain growth in Cu. United States. doi:10.1007/s11661-000-0267-z.
Koo, J.B., Yoon, D.Y., and Henry, M.F. Mon . "Island grains of low misorientation angles formed during abnormal grain growth in Cu". United States. doi:10.1007/s11661-000-0267-z.
@article{osti_20075689,
title = {Island grains of low misorientation angles formed during abnormal grain growth in Cu},
author = {Koo, J.B. and Yoon, D.Y. and Henry, M.F.},
abstractNote = {During abnormal grain growth (AGG) or secondary recrystallization, some small grains are entrapped in the growing large grains and become island grains. In this report, the authors describe the observations of island grains formed during annealing of pure Cu, their orientations determined by electron backscattered pattern (EBSP), and their shrinkage upon further annealing. They discuss the observations in terms of the dependence of the grain boundary migration on its structure.},
doi = {10.1007/s11661-000-0267-z},
journal = {Metallurgical and Materials Transactions. A, Physical Metallurgy and Materials Science},
issn = {1073-5623},
number = 5,
volume = 31,
place = {United States},
year = {2000},
month = {5}
}