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Title: Oxidation of {l_brace}100{r_brace} and {l_brace}111{r_brace} surfaces of pyrite: Effects of preparation method

Journal Article · · American Mineralogist
DOI:https://doi.org/10.2138/am-2000-0428· OSTI ID:20020896

Photoelectron spectroscopy was used to investigate the surface structure and reactivity of two pyrite {l_brace}100{r_brace} surfaces, prepared by different means. Specifically, synchrotron-based S 2 p photoemission data for a {l_brace}100{r_brace} pyrite growth surface prepared by exposure to HCl, and one resulting from mechanical fracture suggested that the acid-washed growth surface showed a higher concentration of elemental sulfur and/or polysulfide impurities. The surfaces, however, showed a similar initial oxidation reactivity under a well-controlled H{sub 2}O/O{sub 2} gaseous environment, implying that the fraction of both surfaces that underwent the initial oxidation reaction were similar in structure. The amount of initial oxidation on these surfaces, however, was significantly lower than on an acid-washed {l_brace}111{r_brace} growth surface. Photoelectron and ion scattering spectroscopy offer some possible reasons for this structure sensitivity.

Research Organization:
Temple Univ., Philadelphia, PA (US)
Sponsoring Organization:
USDOE
DOE Contract Number:
FG02-96ER14644; FG02-96ER14633; AC02-98CH10886
OSTI ID:
20020896
Journal Information:
American Mineralogist, Vol. 85, Issue 3-4; Other Information: PBD: Mar-Apr 2000; ISSN 0003-004X
Country of Publication:
United States
Language:
English

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