Robustness of Cascode GaN HEMTs in Unclamped Inductive Switching

Song, Qihao; Zhang, Ruizhe; Kozak, Joseph; Liu, Jingcun; Li, Qiang; Zhang, Yuhao

doi:10.1109/tpel.2021.3122740

Robustness of Cascode GaN HEMTs in Unclamped Inductive Switching

Journal Article · 01 April 2022 · IEEE Transactions on Power Electronics

DOI:https://doi.org/10.1109/tpel.2021.3122740· OSTI ID:1982889

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Research Organization:: Virginia Polytechnic Inst. and State Univ. (Virginia Tech), Blacksburg, VA (United States)

Sponsoring Organization:: USDOE

OSTI ID:: 1982889

Journal Information:: IEEE Transactions on Power Electronics, Journal Name: IEEE Transactions on Power Electronics Journal Issue: 4 Vol. 37; ISSN 0885-8993

Publisher:: IEEE

Country of Publication:: United States

Language:: English

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