Tip-Enhanced Raman Scattering Imaging of Single- to Few-Layer Ti 3 C 2 T x MXene

Sarycheva, Asia; Shanmugasundaram, Maruda; Krayev, Andrey; Gogotsi, Yury

doi:10.1021/acsnano.2c01868

Tip-Enhanced Raman Scattering Imaging of Single- to Few-Layer Ti ₃ C ₂ T _x MXene

Journal Article · 11 April 2022 · ACS Nano

DOI:https://doi.org/10.1021/acsnano.2c01868· OSTI ID:1982032

^[1]; Shanmugasundaram, Maruda ^[2]; ^[2]; ^[1]

A. J. Drexel Nanomaterials Institute, and Department of Materials Science and Engineering, Drexel University, Philadelphia, Pennsylvania 19104, United States
HORIBA Scientific 20 Knightsbridge Road, Piscataway, New Jersey 08854, United States

Not provided.

Research Organization:: Energy Frontier Research Centers (EFRC) (United States). Fluid Interface Reactions, Structures and Transport Center (FIRST)

Sponsoring Organization:: USDOE

OSTI ID:: 1982032

Journal Information:: ACS Nano, Vol. 16, Issue 4; ISSN 1936-0851

Publisher:: American Chemical Society (ACS)

Country of Publication:: United States

Language:: English

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