Deep Well Trapping of Hot Carriers in a Hexagonal Boron Nitride Coating of Polymer Dielectrics
Journal Article
·
· ACS Applied Materials and Interfaces
- Collaboratory for Advanced Computing and Simulations, University of Southern California, Los Angeles, California 90089-0242, United States
- Electrical Insulation Research Center, Institute of Materials Science, University of Connecticut, Storrs, Connecticut 06269, United States
- School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332, United States
- Department of Physics, Kumamoto University, Kumamoto 860-8555, Japan
- Institute of Materials Science, University of Connecticut, Storrs, Connecticut 06269, United States
Not provided.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States). Argonne Leadership Computing Facility (ALCF)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC02-06CH11357
- OSTI ID:
- 1981983
- Journal Information:
- ACS Applied Materials and Interfaces, Vol. 13, Issue 50; ISSN 1944-8244
- Publisher:
- American Chemical Society (ACS)
- Country of Publication:
- United States
- Language:
- English
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