Observation of grain boundary plasmon and associated deconvolution techniques for low-loss electron energy-loss (EEL) spectra acquired from grain boundaries

Nandi, Proloy; Hoglund, Eric R.; Howe, James M.

doi:10.1016/j.ultramic.2022.113478

Observation of grain boundary plasmon and associated deconvolution techniques for low-loss electron energy-loss (EEL) spectra acquired from grain boundaries

Journal Article · 01 April 2022 · Ultramicroscopy

DOI:https://doi.org/10.1016/j.ultramic.2022.113478· OSTI ID:1981786

Nandi, Proloy; Hoglund, Eric R.; Howe, James M.

Not provided.

Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States). Center for Functional Nanomaterials (CFN)

Sponsoring Organization:: USDOE Office of Science (SC)

DOE Contract Number:: SC0012704

OSTI ID:: 1981786

Journal Information:: Ultramicroscopy, Vol. 234, Issue C; ISSN 0304-3991

Publisher:: Elsevier

Country of Publication:: United States

Language:: English

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Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopy Egerton, R. F. Ultramicroscopy, Vol. 107, Issue 8 https://doi.org/10.1016/j.ultramic.2006.11.005	journal	August 2007
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Determining the Electron Density and Volume Expansion at Grain Boundaries Using Electron Energy-Loss Spectroscopy Nandi, Proloy; Hoglund, Eric; Sang, Xiahan Microscopy and Microanalysis, Vol. 23, Issue S1 https://doi.org/10.1017/S1431927617002756	journal	July 2017
Fourier-ratio deconvolution techniques for electron energy-loss spectroscopy (EELS) Wang, Feng; Egerton, Ray; Malac, Marek Ultramicroscopy, Vol. 109, Issue 10 https://doi.org/10.1016/j.ultramic.2009.05.011	journal	September 2009
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