In-situ imaging of advanced materials subjected to in-plane biaxial loading using X-ray micro-computed tomography

French, Jordan; Dahlkamp, Chris; Befus, Elliot; Czabaj, Michael W.

doi:10.1016/j.compscitech.2022.109453

In-situ imaging of advanced materials subjected to in-plane biaxial loading using X-ray micro-computed tomography

Journal Article · 01 June 2022 · Composites Science and Technology

DOI:https://doi.org/10.1016/j.compscitech.2022.109453· OSTI ID:1981589

French, Jordan; ; Befus, Elliot;

Not provided.

Research Organization:: Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)

Sponsoring Organization:: USDOE

DOE Contract Number:: AC02-05CH11231

OSTI ID:: 1981589

Journal Information:: Composites Science and Technology, Vol. 224, Issue C; ISSN 0266-3538

Publisher:: Elsevier

Country of Publication:: United States

Language:: English

References (26)

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