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Modeling Logic Error Single-Event Cross Sections at the 7-nm Bulk FinFET Technology Node

Journal Article · · IEEE Transactions on Nuclear Science

Not provided.

Research Organization:
Krell Institute, Ames, IA (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
NA0003960
OSTI ID:
1980531
Journal Information:
IEEE Transactions on Nuclear Science, Vol. 69, Issue 3; ISSN 0018-9499
Publisher:
IEEE
Country of Publication:
United States
Language:
English

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Analysis of Bulk FinFET Structural Effects on Single-Event Cross Sections journal January 2017
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