Modeling Logic Error Single-Event Cross Sections at the 7-nm Bulk FinFET Technology Node
Journal Article
·
· IEEE Transactions on Nuclear Science
Not provided.
- Research Organization:
- Krell Institute, Ames, IA (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- NA0003960
- OSTI ID:
- 1980531
- Journal Information:
- IEEE Transactions on Nuclear Science, Vol. 69, Issue 3; ISSN 0018-9499
- Publisher:
- IEEE
- Country of Publication:
- United States
- Language:
- English
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