Port Parameter Extraction-Based Self-Consistent Coupled EM-Circuit FEM Solvers

Ramachandran, Omkar H.; O'Connor, Scott; Crawford, Zane D.; Kempel, Leo C.; Shanker, B.

doi:10.1109/tcpmt.2022.3173487

Port Parameter Extraction-Based Self-Consistent Coupled EM-Circuit FEM Solvers

Journal Article · 01 June 2022 · IEEE Transactions on Components, Packaging, and Manufacturing Technology

DOI:https://doi.org/10.1109/tcpmt.2022.3173487· OSTI ID:1980467

^[1]; ^[1]; ^[1]; Kempel, Leo C. ^[1]; ^[1]

Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI, USA

Not provided.

Research Organization:: Krell Institute, Ames, IA (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

DOE Contract Number:: FG02-97ER25308

OSTI ID:: 1980467

Journal Information:: IEEE Transactions on Components, Packaging, and Manufacturing Technology, Vol. 12, Issue 6; ISSN 2156-3950

Publisher:: IEEE

Country of Publication:: United States

Language:: English

References (20)

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