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Plasmon spectroscopy for the determination of Ti 3 C 2 T x MXene few layer stacks architecture

Journal Article · · 2D Materials
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Like many 2D materials, numerous properties of MXene multilayers, and especially the most popular one Ti3C2Tx, have been shown to significantly depend on their architecture, i.e. the number of layers and interlayer distance. These structural parameters are thus key elements to be characterized for the analysis of MXene properties. Focusing on valence electron energy-loss spectroscopy (VEELS) as performed in a transmission electron microscope (TEM), and using density functional theory (DFT) simulations, we here analyze the layer dependent large changes in the VEEL spectra of Ti3C2Txmultilayers as a probe of their total thickness, and emphasize the bulk plasmon energy sensitivity to interlayer distance. Together these findings allow to directly quantify the absolute number of layers in a Ti3C2Txstack up to ~10 nm thickness and give access to interlayer distance modifications with sub-angström sensitivity, evidencing VEELS as a powerful method for the characterization of MXene multilayers on the nanometer scale. We expect these results to be relevant for the study of structure/properties correlations in this class of materials, especially with the development ofin situor environmental TEM experiments.

Research Organization:
Univ. of Illinois at Urbana-Champaign, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
DOE Contract Number:
SC0022060
OSTI ID:
1979458
Journal Information:
2D Materials, Vol. 9, Issue 3; ISSN 2053-1583
Publisher:
IOP Publishing
Country of Publication:
United States
Language:
English

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