Transient Strain-Induced Electronic Structure Modulation in a Semiconducting Polymer Imaged by Scanning Ultrafast Electron Microscopy

Kim, Taeyong; Oh, Saejin; Choudhry, Usama; Meinhart, Carl D.; Chabinyc, Michael L.; Liao, Bolin

doi:10.1021/acs.nanolett.1c02963

Transient Strain-Induced Electronic Structure Modulation in a Semiconducting Polymer Imaged by Scanning Ultrafast Electron Microscopy

Journal Article · 21 October 2021 · Nano Letters

DOI:https://doi.org/10.1021/acs.nanolett.1c02963· OSTI ID:1978173

Kim, Taeyong ^[1]; Oh, Saejin ^[2]; Choudhry, Usama ^[1]; ^[1]; ^[3]; ^[1]

Department of Mechanical Engineering, University of California, Santa Barbara, California 93106, United States
Department of Chemistry and Biochemistry, University of California, Santa Barbara, California 93106, United States
Materials Department, University of California, Santa Barbara, California 93106, United States

Not provided.

Research Organization:: Univ. of California, Santa Barbara, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

DOE Contract Number:: SC0019244

OSTI ID:: 1978173

Journal Information:: Nano Letters, Vol. 21, Issue 21; ISSN 1530-6984

Publisher:: American Chemical Society

Country of Publication:: United States

Language:: English

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