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Ultrahigh-Resolution, Label-Free Hyperlens Imaging in the Mid-IR

Journal Article · · Nano Letters
 [1];  [2];  [3];  [4];  [5];  [6];  [7];  [3];  [1];  [8];  [8];  [3];  [4];  [1]
  1. Department of Mechanical Engineering, Vanderbilt University, Nashville, Tennessee 37212, United States
  2. ASEE/NRC Postdoctoral Fellow residing at NRL, Washington D.C. 20375, United States; U.S. Naval Research Laboratory, Washington D.C. 20375, United States
  3. Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544, United States
  4. Department of Physics, Columbia University, New York, New York 10027, United States
  5. U.S. Naval Research Laboratory, Washington D.C. 20375, United States
  6. Department of Mechanical Engineering, Vanderbilt University, Nashville, Tennessee 37212, United States; Department of Physics and Astronomy, The University of Iowa, Iowa City, Iowa 52242, United States
  7. ASEE/NRC Postdoctoral Fellow residing at NRL, Washington D.C. 20375, United States
  8. Tim Taylor Department of Chemical Engineering, Kansas State University, Manhattan, Kansas 66506, United States

Not provided.

Research Organization:
Columbia Univ., New York, NY (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
DOE Contract Number:
SC0019443
OSTI ID:
1978168
Journal Information:
Nano Letters, Vol. 21, Issue 19; ISSN 1530-6984
Publisher:
American Chemical Society
Country of Publication:
United States
Language:
English

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