Characterization of vertical Bridgman grown Cd0.9Zn0.1Te0.97Se0.03 single crystal for room-temperature radiation detection

Nag, Ritwik; Chaudhuri, Sandeep K.; Kleppinger, Joshua W.; Karadavut, OmerFaruk; Mandal, Krishna C.

doi:10.1007/s10854-021-07051-6

Characterization of vertical Bridgman grown Cd0.9Zn0.1Te0.97Se0.03 single crystal for room-temperature radiation detection

Journal Article · 25 September 2021 · Journal of Materials Science. Materials in Electronics

DOI:https://doi.org/10.1007/s10854-021-07051-6· OSTI ID:1976685

Nag, Ritwik; ; Kleppinger, Joshua W.; Karadavut, OmerFaruk;

Not provided.

Research Organization:: Univ. of South Carolina, Columbia, SC (United States); UT-Battelle LLC/ORNL, Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE Office of Nuclear Energy (NE)

DOE Contract Number:: NE0008662; AC07-05ID14517

OSTI ID:: 1976685

Journal Information:: Journal of Materials Science. Materials in Electronics, Vol. 32, Issue 22; ISSN 0957-4522

Publisher:: Springer

Country of Publication:: United States

Language:: English

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