Nanoscale Optical Imaging of 2D Semiconductor Stacking Orders by Exciton-Enhanced Second Harmonic Generation

Yao, Kaiyuan; Zhang, Shuai; Yanev, Emanuil; McCreary, Kathleen; Chuang, Hsun‐Jen; Rosenberger, Matthew R.; Darlington, Thomas; Krayev, Andrey; Jonker, Berend T.; Hone, James C.; Basov, D. N.; Schuck, P. James

doi:10.1002/adom.202200085

Nanoscale Optical Imaging of 2D Semiconductor Stacking Orders by Exciton-Enhanced Second Harmonic Generation

Journal Article · 10 April 2022 · Advanced Optical Materials

DOI:https://doi.org/10.1002/adom.202200085· OSTI ID:1976232

Yao, Kaiyuan ^[1]; ^[2]; Yanev, Emanuil ^[1]; McCreary, Kathleen ^[3]; Chuang, Hsun‐Jen ^[4]; Rosenberger, Matthew R. ^[5]; Darlington, Thomas ^[1]; Krayev, Andrey ^[6]; Jonker, Berend T. ^[3]; Hone, James C. ^[1]; Basov, D. N. ^[2]; ^[1]

Department of Mechanical Engineering Columbia University New York NY 10027 USA
Department of Physics Columbia University New York NY 10027 USA
Materials Science &, Technology Division Naval Research Laboratory Washington DC 20375 USA
Materials Science &, Technology Division Naval Research Laboratory Washington DC 20375 USA; Nova Research Inc. Washington DC 22308 USA
University of Notre Dame Notre Dame IN 46556 USA
Horiba Scientific Novato CA 94085 USA

Not provided.

Research Organization:: Columbia Univ., New York, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

DOE Contract Number:: SC0019443

OSTI ID:: 1976232

Journal Information:: Advanced Optical Materials, Vol. 10, Issue 12; ISSN 2195-1071

Publisher:: Wiley

Country of Publication:: United States

Language:: English

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