Ray-Tracing Simulation Analysis of Effective Penetration Depths on Grazing Incidence Synchrotron X-

Cheng, Qianyu; Peng, Hongyu; Hu, Shanshan; Chen, Zeyu; Liu, Yafei; Raghothamachar, Balaji; Dudley, Michael

doi:10.4028/p-2kzz01

Ray-Tracing Simulation Analysis of Effective Penetration Depths on Grazing Incidence Synchrotron X-

Journal Article · 01 May 2022 · Mater. Sci. Forum

DOI:https://doi.org/10.4028/p-2kzz01· OSTI ID:1901319

Cheng, Qianyu; Peng, Hongyu; Hu, Shanshan; Chen, Zeyu; Liu, Yafei; Raghothamachar, Balaji; Dudley, Michael

Research Organization:: Advanced Photon Source (APS), Argonne National Laboratory (ANL), Argonne, IL (US)

Sponsoring Organization:: DOE - Office Of Science; DARPA

OSTI ID:: 1901319

Journal Information:: Mater. Sci. Forum, Journal Name: Mater. Sci. Forum Vol. 1062

Country of Publication:: United States

Language:: ENGLISH

References (9)

Superscrew dislocation contrast on synchrotron white-beam topographs: an accurate description of the direct dislocation image Huang, X. R.; Dudley, M.; Vetter, W. M. Journal of Applied Crystallography, Vol. 32, Issue 3 https://doi.org/10.1107/S0021889899002939	journal	June 1999
NIH Image to ImageJ: 25 years of image analysis Schneider, Caroline A.; Rasband, Wayne S.; Eliceiri, Kevin W. Nature Methods, Vol. 9, Issue 7 https://doi.org/10.1038/nmeth.2089	journal	June 2012
Assessment of orientation and extinction contrast contributions to the direct dislocation image Dudley, M.; Huang, X. R.; Huang, W. Journal of Physics D: Applied Physics, Vol. 32, Issue 10A https://doi.org/10.1088/0022-3727/32/10A/329	journal	January 1999
Influence of surface relaxation on the contrast of threading edge dislocations in synchrotron X-ray topographs under the condition of g · b = 0 and g · b × l = 0 Peng, Hongyu; Ailihumaer, Tuerxun; Fujie, Fumihiro Journal of Applied Crystallography, Vol. 54, Issue 2 https://doi.org/10.1107/S160057672100025X	journal	February 2021
Determination of observable depth of dislocations in 4H-SiC by X-ray topography in back reflection Ishiji, Kotaro; Kawado, Seiji; Hirai, Yasuharu Japanese Journal of Applied Physics, Vol. 56, Issue 10 https://doi.org/10.7567/JJAP.56.106601	journal	September 2017
Determination of penetration depths and analysis of strains in single crystals by white beam synchrotron X-ray topography in grazing Bragg-Laue geometries Dudley, M.; Wu, J.; Yao, G. D. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol. 40-41 https://doi.org/10.1016/0168-583X(89)91005-7	journal	April 1989
Surface relaxation and photoelectric absorption effects on synchrotron X-ray topographic images of dislocations lying on the basal plane in off-axis 4H-SiC crystals Ailihumaer, Tuerxun; Peng, Hongyu; Fujie, Fumihiro Materials Science and Engineering: B, Vol. 271 https://doi.org/10.1016/j.mseb.2021.115281	journal	September 2021
Synchrotron X-ray topographic image contrast variation of screw-type basal plane dislocations located at different depths below the crystal surface in 4H-SiC Fujie, Fumihiro; Peng, Hongyu; Ailihumaer, Tuerxun Acta Materialia, Vol. 208 https://doi.org/10.1016/j.actamat.2021.116746	journal	April 2021
Contrast of Dislocation Images in X-Ray Transmission Topography Authier, A. Advances in X-ray Analysis, Vol. 10 https://doi.org/10.1154/S0376030800004250	journal	January 1966

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