skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Ray-Tracing Simulation Analysis of Effective Penetration Depths on Grazing Incidence Synchrotron X-

Journal Article · · Mater. Sci. Forum
DOI:https://doi.org/10.4028/p-2kzz01· OSTI ID:1901319
; ; ; ; ; ;

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Organization:
DOE - Office Of Science; Defense Advanced Research Projects Agency (DARPA)
OSTI ID:
1901319
Journal Information:
Mater. Sci. Forum, Vol. 1062
Country of Publication:
United States
Language:
ENGLISH

References (9)

Determination of penetration depths and analysis of strains in single crystals by white beam synchrotron X-ray topography in grazing Bragg-Laue geometries journal April 1989
Contrast of Dislocation Images in X-Ray Transmission Topography journal January 1966
Assessment of orientation and extinction contrast contributions to the direct dislocation image journal January 1999
Superscrew dislocation contrast on synchrotron white-beam topographs: an accurate description of the direct dislocation image journal June 1999
Determination of observable depth of dislocations in 4H-SiC by X-ray topography in back reflection journal September 2017
Influence of surface relaxation on the contrast of threading edge dislocations in synchrotron X-ray topographs under the condition of g  ·  b = 0 and g  ·  b  ×  l = 0 journal February 2021
Synchrotron X-ray topographic image contrast variation of screw-type basal plane dislocations located at different depths below the crystal surface in 4H-SiC journal April 2021
Surface relaxation and photoelectric absorption effects on synchrotron X-ray topographic images of dislocations lying on the basal plane in off-axis 4H-SiC crystals journal September 2021
NIH Image to ImageJ: 25 years of image analysis journal June 2012

Similar Records

Related Subjects