Influence of surface relaxation on the contrast of threading edge dislocations in synchrotron X-ray

Peng, Hongyu; Ailihumaer, Tuerxun; Fujie, Fumihiro; Chen, Zeyu; Raghothamachar, Balaji; Dudley, Michael

doi:10.1107/S160057672100025X

Influence of surface relaxation on the contrast of threading edge dislocations in synchrotron X-ray

Journal Article · 01 April 2021 · J. Appl. Crystallogr.

DOI:https://doi.org/10.1107/S160057672100025X· OSTI ID:1901251

Peng, Hongyu; Ailihumaer, Tuerxun; Fujie, Fumihiro; Chen, Zeyu; Raghothamachar, Balaji; Dudley, Michael

Research Organization:: Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)

Sponsoring Organization:: DOE - Office Of Science

OSTI ID:: 1901251

Journal Information:: J. Appl. Crystallogr., Vol. 54, Issue (2)

Country of Publication:: United States

Language:: ENGLISH

References (12)

Sense determination of micropipes via grazing-incidence synchrotron white beam x-ray topography in 4H silicon carbide Chen, Y.; Dhanaraj, G.; Dudley, M. Applied Physics Letters, Vol. 91, Issue 7 https://doi.org/10.1063/1.2772190	journal	August 2007
Direct determination of dislocation sense of closed-core threading screw dislocations using synchrotron white beam x-ray topography in 4H silicon carbide Chen, Yi; Dudley, Michael Applied Physics Letters, Vol. 91, Issue 14 https://doi.org/10.1063/1.2793705	journal	October 2007
Assessment of orientation and extinction contrast contributions to the direct dislocation image Dudley, M.; Huang, X. R.; Huang, W. Journal of Physics D: Applied Physics, Vol. 32, Issue 10A https://doi.org/10.1088/0022-3727/32/10A/329	journal	January 1999
CXL. Dislocations in thin plates Eshelby, J. D.; Stroh, A. N. The London, Edinburgh, and Dublin Philosophical Magazine and Journal of Science, Vol. 42, Issue 335 https://doi.org/10.1080/14786445108560958	journal	December 1951
Superscrew dislocation contrast on synchrotron white-beam topographs: an accurate description of the direct dislocation image Huang, X. R.; Dudley, M.; Vetter, W. M. Journal of Applied Crystallography, Vol. 32, Issue 3 https://doi.org/10.1107/S0021889899002939	journal	June 1999
On the widths of dislocation images in X-ray topography under low-absorption conditions Miltat, J. E. A.; Bowen, D. K. Journal of Applied Crystallography, Vol. 8, Issue 6 https://doi.org/10.1107/S0021889875011569	journal	December 1975
Defect analysis in crystals using X-ray topography Raghothamachar, Balaji; Dhanaraj, Govindhan; Bai, Jie Microscopy Research and Technique, Vol. 69, Issue 5 https://doi.org/10.1002/jemt.20290	journal	January 2006
Nucleation of threading dislocations in sublimation grown silicon carbide Sanchez, E. K.; Liu, J. Q.; De Graef, M. Journal of Applied Physics, Vol. 91, Issue 3 https://doi.org/10.1063/1.1428088	journal	February 2002
The displacement and stress fields of a general dislocation close to a free surface of an isotropic solid Shaibani, S. J.; Hazzledine, P. M. Philosophical Magazine A, Vol. 44, Issue 3 https://doi.org/10.1080/01418618108236168	journal	September 1981
Surface-relaxation contributions to axial screw dislocation contrast in synchrotron white-beam X-ray topographs of SiC Vetter, W. M.; Dudley, M. Journal of Applied Crystallography, Vol. 35, Issue 6 https://doi.org/10.1107/S0021889802016175	journal	November 2002
Simulation of threading dislocation images in X-ray topographs of silicon carbide homo-epilayers Vetter, W. M.; Tsuchida, H.; Kamata, I. Journal of Applied Crystallography, Vol. 38, Issue 3 https://doi.org/10.1107/S0021889805005819	journal	May 2005
Influence of Surface Relaxation and Multi-Dislocation Strain Field Interactions on X-ray Topographic Images of Dislocations in Semiconductor Materials Wu, Jun; Fannin, Thomas; Dudley, Michael MRS Proceedings, Vol. 262 https://doi.org/10.1557/PROC-262-265	journal	January 1992

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